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BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry >
BS ISO 11505:2012 Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry, 2013
- Section sec_1
- Section sec_2
- Section sec_3
- Section sec_4
- Section sec_4.1
- Section sec_4.1.1
- Section sec_4.1.2
- Section sec_4.1.3
- Section sec_4.1.3.1
- Section sec_4.1.3.2
- Section sec_4.1.3.3
- Section sec_5
- Section sec_5.1
- Section sec_5.2
- Section sec_5.2.1
- Section sec_5.2.1.1
- Section sec_5.2.1.2
- Section sec_5.2.1.3
- Section sec_5.2.1.4
- Section sec_5.2.2
- Section sec_5.2.2.1
- Section sec_5.3
- Section sec_5.3.1
- Section sec_5.3.2
- Section sec_5.3.3
- Section sec_5.4
- Section sec_5.4.1
- Section sec_5.4.2
- Section sec_5.4.3
- Section sec_5.4.3.1
- Section sec_5.4.3.2
- Section sec_5.4.3.3
- Section sec_6
- Section sec_7
- Section sec_7.1
- Section sec_7.2
- Section sec_7.2.1
- Section sec_7.2.2
- Section sec_7.2.3
- Section sec_7.2.4
- Section sec_7.2.5
- Section sec_7.2.6
- Section sec_7.2.7
- Section sec_7.2.8
- Section sec_7.3
- Section sec_7.4
- Section sec_7.5
- Section sec_7.6
- Section sec_7.7
- Section sec_7.7.1
- Section sec_7.7.2
- Section sec_7.7.3
- Section sec_7.8
- Section sec_8
- Section sec_8.1
- Section sec_8.2
- Section sec_8.3
- Section sec_9
- Section sec_9.1
- Table tab_c
- Figure fig_1
- Section sec_9.2
- Section sec_9.2.1
- Section sec_9.2.2
- Section sec_9.3
- Section sec_10
- Section sec_11
- Annex sec_A
- Annex sec_A.1
- Annex sec_A.2
- Annex sec_A.2.1
- Annex sec_A.2.2
- Annex sec_A.2.3
- Annex sec_A.3
- Annex sec_A.4
- Annex sec_A.5
- Annex sec_A.5.1
- Annex sec_A.5.2
- Annex sec_A.5.3
- Annex sec_A.5.4
- Annex sec_A.6
- Annex sec_A.6.1
- Annex sec_A.6.2
- Annex sec_A.6.3
- Annex sec_A.7
- Annex sec_A.7.1
- Annex sec_A.7.2
- Annex sec_A.7.3
- Annex sec_A.8
- Annex sec_A.8.1
- Annex sec_A.8.2
- Annex sec_A.8.3
- Annex sec_A.9
- Annex sec_A.9.1
- Annex sec_A.9.2
- Annex sec_A.9.3
- Annex sec_B
- Reference ref_1
- Reference ref_2
- Reference ref_3
- Reference ref_4
- Reference ref_5
- Reference ref_6
- Reference ref_7
- Reference ref_8
- Reference ref_9
- Reference ref_10
- Reference ref_11
- Reference ref_12
- Reference ref_13
- Reference ref_14
- Reference ref_15
- Reference ref_16
- Reference ref_17
- Reference ref_18
- Reference ref_19
- Reference ref_20
- Foreword
- 1 Scope
- 2 Normative references
- 3 Principle
- 4 Apparatus
- 4.1 Glow discharge optical emission spectrometer
- 5 Adjusting the glow discharge spectrometer system settings
- 5.1 General
- 5.2 Setting the discharge parameters of a DC source
- 5.3 Setting the discharge parameters of an RF source
- 5.4 Minimum performance requirements
- 6 Sampling
- 7 Calibration
- 7.1 General
- 7.2 Calibration specimens
- 7.3 Validation specimens
- 7.4 Determination of the sputtering rate of calibration and validation specimens
- 7.5 Emission intensity measurements of calibration specimens
- 7.6 Calculation of calibration equations
- 7.7 Validation of the calibration
- 7.8 Verification and drift correction
- 8 Analysis of test specimens
- 8.1 Adjusting discharge parameters
- 8.2 Setting of measuring time and data acquisition rate
- 8.3 Quantifying depth profiles of test specimens
- 9 Expression of results
- 9.1 Expression of quantitative depth profile
- 9.2 Determination of total coating mass per unit area
- 9.3 Determination of average mass fractions
- 10 Precision
- 11 Test report
- Annex A (normative) Calculation of calibration constants and quantitative evaluation of depth profiles
- Annex B (informative) Suggested spectral lines for determination of given elements
- Bibliography [Go to Page]