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Content

All Books

Found 45 books ICS 31.080.10

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	Format	Year	Publisher	Type	Title
		2019	ASTM	Model Standard	D3233-19 Standard Test Methods for Measurement of Extreme Pressure Properties of Fluid Lubricants (Falex Pin and Vee Block Methods)
		2015	ASTM	Model Standard	C1731-15 Standard Specification for Concrete Floor Tile
		2016	ASTM	Model Standard	D7320-16 Standard Test Method for Evaluation of Automotive Engine Oils in the Sequence IIIG, Spark-Ignition Engine
		2024	ASTM	Model Standard	C1063-24 Standard Specification for Installation of Lathing and Furring to Receive Interior and Exterior Portland Cement-Based Plaster
		2017	BSI	Standards	BS ISO 12222:2017 Cinematography. Manufacturer-printed, latent image identification on 16 mm, 35 mm and 65 mm motion-picture film. Specifications and dimensions
		2021	ASTM	Model Standard	D8062-21 Standard Specification for Purified Terephthalic Acid (PTA) with Low p-Toluic Acid
		2017	ASTM	Model Standard	F17-17 Standard Terminology Relating to Primary Barrier Packaging
		2023	NFPA	Model Standard	NFPA 301: Code for Safety to Life from Fire on Merchant Vessels
		2022	BSI	Standards	BS ISO/IEC 2382-37:2022 Information technology. Vocabulary - Biometrics
		2017	BSI	Standards	PD ISO/TR 29922:2017 Natural gas. Supporting information on the calculation of physical properties according to ISO 6976
		2019	ASTM	Model Standard	D5553-95(2019) Standard Test Method for Determination of the Unsaponifiable Nonvolatile Matter in Sulfated Oils
		2025	BSI	Standards	BS EN 17914:2025 Chemical disinfectants and antiseptics. Quantitative suspension test for the evaluation of virucidal activity in the food, industrial, domestic and institutional area. Test method and requirements (Phase 2/Step 1)
		2024	ISO	Standards	ISO 10855-2:2024 Offshore containers and associated lifting sets - Part 2: Design, manufacture and marking of lifting sets
		2024	ISO	Standards	ISO 5686-1:2024 Polygonal turret interface with flat contact surface - Part 1: Shanks of type F, H and A
		2019	ASTM	Model Standard	C67/C67M-19 Standard Test Methods for Sampling and Testing Brick and Structural Clay Tile
		2024	BSI	Standards	BS ISO 13317-1:2024 Determination of particle size distribution by gravitational liquid sedimentation methods - General principles, requirements and guidance
		2017	ASTM	Model Standard	D7308-17 Standard Practice for Sample Preparation of Thermoplastic Pavement Marking Materials
		2025	ISO	Standards	ISO 12747:2025 Oil and gas industries including lower carbon energy - Pipeline transportation systems - Requirements and guidance for pipeline life extension assessment
		2025	BSI	Standards	BS ISO 13909-1:2025 Coal and coke. Mechanical sampling - General introduction
		2020	BSI	Standards	BS EN ISO 8970:2020 Timber structures. Testing of joints made with mechanical fasteners. Requirements for timber density
		2025	BSI	Standards	BS EN ISO 16140-3:2021+A1:2025 Microbiology of the food chain. Method validation - Protocol for the verification of reference methods and validated alternative methods in a single laboratory
		2023	ASTM	Model Standard	C1400-23 Standard Guide for Reduction of Efflorescence Potential in New Masonry Walls (Redline)
		2009	ASTM	Model Standard	D4175-09a Standard Terminology Relating to Petroleum, Petroleum Products, and Lubricants
		2013	BSI	Standards	BS EN ISO 80000-2:2013 Quantities and units - Mathematical signs and symbols to be used in the natural sciences and technology
		2024	ASTM	Model Standard	F3202-24 Standard Specification for Solid Wall Poly (Vinyl Chloride) PVC Fittings for Joining Corrugated Wall High Density Polyethylene (PE) and Polypropylene (PP) Piping
		2024	ASTM	Model Standard	E1783/E1783M-24 Standard Specification for Preformed Architectural Strip Seals for Buildings and Parking Structures
		2015	ASTM	Model Standard	D4583-95(2015) Standard Practice for Carbon Black—Calculation of Process Indexes From an Analysis of Process Control Data
		2025	ASTM	Model Standard	D8277-25 Standard Test Method for Wet Filterability of Lubricants and Hydraulic Fluids by Mass Flow Technique (Redline)
		2024	ASTM	Model Standard	D849-15-Reapproved2024: D849-15(2024) Standard Test Method for Copper Strip Corrosion by Industrial Aromatic Hydrocarbons
		2016	ASHRAE	Conference Paper	ST-16-C051 - Developing Benchmarks for U.S. Army Buildings Using Data from the Metering Data Management System
		1984	BSI	Standards	BS EN 143003:1992 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: directly heated negative temperature coefficient thermistors (disc type)
		2008	ASTM	Model Standard	D1711-08 Standard Terminology Relating to Electrical Insulation
		2012	BSI	Standards	BS 8210:2012 Guide to facilities maintenance management
		2025	BSI	Standards	25/30476624 DC BS EN ISO 15548-1 Non-destructive testing — Equipment for eddy current examination - Part 1: Instrument characteristics and verification
		2017	BSI	Standards	17/30345392 DC BS ISO 2100-419. Aerospace elements of electrical and optical connection. Test methods - Part 419. Stability of male contacts in insert
		2025	BSI	Standards	BS IEC 60747-2:2025 - TC Tracked Changes. Semiconductor devices - Discrete devices. Rectifier diodes
		2025	BSI	Standards	BS IEC 60747-2:2025 Semiconductor devices - Discrete devices. Rectifier diodes
		2023	BSI	Standards	23/30451646 DC BS EN IEC 60747-2. Semiconductor devices - Part 2. Discrete devices. Rectifier diodes
		2020	BSI	Standards	BS EN IEC 61643-341:2020 Components for low-voltage surge protection - Performance requirements and test circuits for thyristor surge suppressors (TSS)
		2020	BSI	Standards	BS IEC 60747-4:2007+A1:2017 Semiconductor devices. Discrete devices - Microwave diodes and transistors
		2019	IEEE	Model Standard	C62.59-2019: IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes (Published)
		2019	BSI	Standards	19/30401940 DC BS EN IEC 61643-321. Components for low-voltage surge protection - Part 321. Performance requirements and test circuits for silicon PN-junction voltage limiters
		2019	BSI	Standards	BS EN 62612:2013+A2:2018 Self-ballasted LED lamps for general lighting services with supply voltages > 50 V. Performance requirements
		2018	BSI	Standards	18/30383125 DC BS EN 61643-321. Components for low-voltage surge protective devices - Part 321. Performance requirements and test circuits for silicon PN-junction voltage limiters
		2018	BSI	Standards	BS EN 62612:2013+A11:2017 Self-ballasted LED lamps for general lighting services with supply voltages > 50 V. Performance requirements
		2018	BSI	Standards	BS EN 60747-2:2016 Semiconductor devices - Discrete devices. Rectifier diodes
		2015	BSI	Standards	BS IEC 60747-3:2013 Semiconductor devices - Discrete devices: Signal, switching and regulator diodes
		2014	BSI	Standards	14/30309496 DC BS EN 62612 AMD1. Self-ballasted LED lamps for general lighting services with supply voltages ≤ 50V. Performance requirements
		2009	BSI	Standards	DD IEC/PAS 62612:2009 Self-ballasted LED-lamps for general lighting services. Performance requirements
		2002	BSI	Standards	BS 6493-1.4:1992, IEC 60747-4:1991 Semiconductor devices. Discrete devices - Recommendations for microwave diodes and transistors - Recommendations for microwave devices
		2002	BSI	Standards	BS EN 61643-341:2001 Low voltage surge protective devices - Specification for thyristor surge suppressors (TSS)
		2002	BSI	Standards	BS EN 61643-321:2002 Low voltage surge protective devices - Specifications for avalanche breakdown diode (ABD)
		2000	ASTM	Model Standard	F769-00 Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006)
		2000	BSI	Standards	BS IEC 60747-4-1:2000, QC 750115:2000 Semiconductor devices. Discrete devices - Microwave diodes and transistors. Microwave field effect transistors. Blank detail specification - BDS for microwave field-effect transistors
		2000	BSI	Standards	BS IEC 60747-4-2:2000, QC 750116:2000 Semiconductor devices. Discrete devices - Microwave diodes and transistors. Integrated-circuit microwave amplifiers. Blank detail specification
		2000	BSI	Standards	BS IEC 60747-2:2000 Discrete semiconductor devices and integrated circuits - Rectifier diodes
		1995	BSI	Standards	BS EN 120008:1995 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: light emitting diodes and infrared emitting diodes for fibre optic system or sub-system
		1995	BSI	Standards	BS EN 150014:1997 Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors
		1994	ASTM	Model Standard	F419-94 Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
		1994	BSI	Standards	BS QC 750109:1993, IEC 60747-2-2:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
		1992	BSI	Standards	BS EN 150015:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: unidirectional transient overvoltage suppressor diodes
		1990	BSI	Standards	BS 9306:1979 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: transient suppressor diodes
		1990	BSI	Standards	BS 9323:1976 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave passive limiter diodes
		1990	BSI	Standards	BS QC 750108:1990, IEC 60747-2-1:1989 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A
		1989	BSI	Standards	BS 9307:1975 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: variable capacitance diodes for tuning applications
		1988	BSI	Standards	BS 9329:1977 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: varactor diodes for frequency multiplication
		1987	BSI	Standards	BS QC 750005:1987, IEC 60747-3-2:1986 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes
		1986	BSI	Standards	BS QC 750001:1986, IEC 60747-3-1:1986 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes
		1984	BSI	Standards	BS EN 150013:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes
		1983	BSI	Standards	BS 9370:1983 Specification for capability approval of light emitting and infra-red diode arrays of assessed quality: generic data and methods of test
		1982	BSI	Standards	BS CECC 50008:1982 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes
		1982	BSI	Standards	BS CECC 50009:1982 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes
		1981	BSI	Standards	BS EN 150001:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes
		1976	BSI	Standards	BS EN 150006:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Variable capacitance diode(s)
		1976	BSI	Standards	BS 9324:1976 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: p-i-n microwave active switching diodes
		1974	BSI	Standards	BS 9331 N039 to 046:1974 Detail specification for medium current rectifier diodes. 3 A, 300 V, 600 V, 900 V, 1200 V, hermetically sealed. Full assessment level
		1973	BSI	Standards	BS 9300 C476:1973 Detail specification for silicon avalanche rectifier diode
		1971	BSI	Standards	BS 9300 C155-168:1971 Detail specifications for silicon voltage-regulator diodes
		1971	BSI	Standards	BS 9300 C778:1971 Detail specification for a matched pair of germanium coaxial mixer diodes
		1971	BSI	Standards	BS 9322:1971 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave detector diodes