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eLibrary >
14/30295009 DC BS EN 50630. Time-delayed residual current operated circuit breakers type M without over-current protection or application in circuits with rated currents greater above 32A >
14/30295009 DC BS EN 50630. Time-delayed residual current operated circuit breakers type M without over-current protection or application in circuits with rated currents greater above 32A, 2014
- TC23E_25070_enq1e.pdf [Go to Page]
- Foreword
- 1 Scope
- 2 Normative references
- 3 Terms and definitions [Go to Page]
- 3.1 Definitions relating to currents flowing from live parts to earth
- 3.2 Definitions relating to the energization of a MRCP-D
- 3.3 Definitions relating to the operation and to the functions of MRCP-D
- 3.4 Definitions relating to values and ranges of energizing quantities
- 3.5 Definitions relating to values and ranges of influencing quantities
- 3.6 Definitions relating to terminals
- 3.7 Definitions relating to conditions of operation
- 3.8 Test
- 3.9 Definitions relating to insulation coordination
- 4 Classification [Go to Page]
- 4.1 According to the method of operation [Go to Page]
- 4.1.1 MRCP-D functionally independent of line voltage (see 3.3.4)
- 4.1.2 MRCP-D functionally dependent on line voltage (see 3.3.5)
- 4.2 According to the number of poles
- 4.3 According to behaviour in presence of d.c. components
- 4.4 According to the protection against external influences
- 4.5 According to the method of mounting
- 4.6 According to the method of connection
- 4.7 According to the type of terminals
- 4.8 According to the range of ambient air temperature
- 5 Characteristics of MRCP-Ds [Go to Page]
- 5.1 Summary of characteristics
- 5.2 Rated quantities and other characteristics [Go to Page]
- 5.2.1 Rated voltage [Go to Page]
- 5.2.1.1 Rated operational voltage (Ue)
- 5.2.1.2 Rated insulation voltage (Ui)
- 5.2.1.3 Rated impulse withstand voltage (Uimp)
- 5.2.2 Rated current (In)
- 5.2.3 Rated residual operating current (IΔn)
- 5.2.4 Rated residual non-operating current (IΔno)
- 5.2.5 Rated frequency
- 5.2.6 Rated making and breaking capacity (Im)
- 5.2.7 Rated residual making and breaking capacity (IΔm)
- 5.2.8 Operating characteristics in case of residual currents with d.c. components [Go to Page]
- 5.2.8.1 MRCP-D type AC
- 5.2.8.2 MRCP-D Type A
- 5.3 A MRCP-D for which tripping is ensured for residual sinusoidal alternating currents and residual pulsating direct currents, whether suddenly applied or slowly rising.Standard and preferred values [Go to Page]
- 5.3.1 Standard values of rated voltage (Un)
- 5.3.2 Preferred values of rated current (In)
- 5.3.3 Standard values of rated residual operating current (IΔn)
- 5.3.4 Standard value of residual non-operating current (IΔno)
- 5.3.5 Standard minimum value of non-operating overcurrent in case of a multiphase balanced load through a multipole MRCP-D (see 3.4.2.1)
- 5.3.6 Standard minimum value of the non-operating overcurrent in case of a single-phase load through a three-pole or four-pole MRCP-D (see 3.4.2.2)
- 5.3.7 Preferred value of rated frequency
- 5.3.8 Minimum value of the rated making and breaking capacity (Im)
- 5.3.9 Minimum value of the rated residual making and breaking capacity (IΔm)
- 5.3.10 Standard and preferred values of the rated conditional short-circuit current (Inc) [Go to Page]
- 5.3.10.1 Values up to and including 10 000 A
- 5.3.10.2 Values above 10 000 A
- 5.3.11 Standard values of the rated conditional residual short-circuit current (IΔc) [Go to Page]
- 5.3.11.1 Values up to and including 10 000 A
- 5.3.11.2 Values above 10 000 A
- 5.3.12 Limit values of break time and non-actuating time for MRCP-D of type AC and A [Go to Page]
- 5.3.12.1 Limit values of break time and non-actuating time for alternating residual currents (rms values) for type AC and A
- Table 1 – Limit values of break time and non-actuating time for alternating residual currents (rms values) [Go to Page]
- 5.3.12.2 Maximum values of break time for half-wave residual currents (rms values) for type A
- Table 2 – Maximum values of break time for half-wave pulsating residual currents (rms values) for type A MRCP-D [Go to Page]
- 5.3.13 Standard value of rated impulse withstand voltage (Uimp)
- 5.3.14 Standard ranges of ambient air temperature
- 5.4 Coordination with short-circuit protective devices (SCPDs) [Go to Page]
- 5.4.1 General
- 5.4.2 Rated conditional short-circuit current (Inc)
- 5.4.3 The conditions are those specified in 9.11.2.4 a)
- 5.4.4 Rated conditional residual short-circuit current (IΔc)
- 6 Marking and other product information [Go to Page]
- 6.1 Standard marking
- 6.2 Additional marking
- Table 3 – Requirements for marking
- 7 Standard conditions for operation in service and for installation [Go to Page]
- 7.1 Standard conditions
- Table 4 – Standard conditions for operation in service [Go to Page]
- 7.2 Conditions of installation
- 7.3 Pollution degree
- 8 Requirements for construction and operation [Go to Page]
- 8.1 Mechanical design [Go to Page]
- 8.1.1 General
- 8.1.2 Mechanism
- 8.1.3 Clearances and creepage distances (see Annex B)
- Table 5 – Minimum clearances and creepage distances [Go to Page]
- 8.1.4 Screws, current-carrying parts and connections
- 8.1.5 Terminals for external conductors
- Table 6 – Connectable cross-sections of copper conductors for screw-type terminals [Go to Page]
- 8.1.6 Non-interchangeability
- 8.1.7 Mechanical mounting of plug-in type MRCP-Ds
- 8.2 Protection against electric shock
- 8.3 Dielectric properties and isolating capability
- 8.4 Temperature-rise [Go to Page]
- 8.4.1 Temperature-rise limits
- Table 7 – Temperature-rise values [Go to Page]
- 8.4.2 Ambient air temperature
- 8.5 Operating characteristic
- 8.6 Mechanical and electrical endurance
- 8.7 Performance at short-circuit currents
- 8.8 Resistance to mechanical shock and impact
- 8.9 Resistance to heat
- 8.10 Resistance to abnormal heat and to fire
- 8.11 Test device
- 8.12 Requirements for MRCP-Ds functionally dependent on line voltage
- Table 8 – Requirements for MRCP-Ds functionally dependent on line voltage [Go to Page]
- 8.13 Behaviour of MRCP-Ds in case of overcurrents in the main circuit
- 8.14 Behaviour of MRCP-Ds in the case of current surges caused by impulse voltages
- 8.15 Behaviour of MRCP-Ds in case of earth fault currents comprising a d.c. component
- 8.16 Reliability
- 8.17 Electromagnetic Compatibility (EMC)
- 8.18 Behaviour of MRCP-Ds at low ambient air temperatures
- 9 Tests [Go to Page]
- 9.1 General
- Table 9 – List of type tests [Go to Page]
- 9.2 Test conditions
- Table 10 – Test copper conductors corresponding to the rated currents [Go to Page]
- 9.3 Test of indelibility of marking
- 9.4 Test of reliability of screws, current-carrying parts and connections
- Table 11 – Screw thread diameters and applied torques [Go to Page]
- 9.5 Test of reliability of screw-type terminals for external copper conductors
- Table 12 – Pulling forces
- Table 13 – Conductor dimensions [Go to Page]
- 9.6 Verification of protection against electric shock
- 9.7 Test of dielectric properties and isolating capability [Go to Page]
- 9.7.1 Resistance to humidity [Go to Page]
- 9.7.1.1 Preparation of the MRCP-D for test
- 9.7.1.2 Test conditions
- 9.7.1.3 Test procedure
- 9.7.1.4 Condition of the MRCP-D after the test
- 9.7.2 Insulation resistance of the main circuit
- 9.7.3 Dielectric strength of the main circuit
- 9.7.4 Insulation resistance and dielectric strength of auxiliary circuits
- Table 14 – Test voltage of auxiliary circuits [Go to Page]
- 9.7.5 Secondary circuit of detection transformers
- 9.7.6 Capability of control circuits connected to the main circuit in respect of withstanding high d.c. voltages due to insulation measurements
- 9.7.7 Verification of impulse withstand voltages (across clearances and across solid insulation) and of leakage current across open contacts [Go to Page]
- 9.7.7.1 Verification of impulse withstand voltage across the open contacts (suitability for isolation)
- Table 15 – Test voltage across the open contacts for verifying the suitability for isolation, referred to the rated impulse withstand voltage of the MRCP-D and the altitude where the test is carried out [Go to Page]
- 9.7.7.2 Verification of impulse withstand voltage for the parts not tested in 9.7.7.1
- Table 16 − Test voltage for verification of impulse withstand voltage for the parts not tested in 9.7.7.1 [Go to Page]
- 9.7.7.3 Verification of leakage currents across open contacts (suitability for isolation)
- 9.8 Test of temperature-rise [Go to Page]
- 9.8.1 Ambient air temperature
- 9.8.2 Test procedure
- 9.8.3 Measurement of the temperature of parts
- 9.8.4 Temperature-rise of a part
- 9.9 Verification of the operating characteristic [Go to Page]
- 9.9.1 Test circuit
- 9.9.2 Off-load tests with residual sinusoidal alternating currents at the reference temperature of 20 C ± 5 C [Go to Page]
- 9.9.2.1 Verification of the correct operation in case of a steady increase of the residual current
- 9.9.2.2 Verification of the correct operation at closing on residual current
- 9.9.2.3 Verification of the correct operation in case of sudden appearance of sinusoidal a.c. residual current
- 9.9.2.4 Verification of the correct operation in case of sudden appearance of residual currents of values between 5 IΔn and 500 A
- 9.9.3 Verification of the correct operation with load at the reference temperature
- 9.9.4 Tests at the temperature limits
- 9.9.5 Particular test conditions for MRCP-Ds functionally dependent on line voltage
- 9.10 Verification of mechanical and electrical endurance [Go to Page]
- 9.10.1 General test conditions
- 9.10.2 Test procedure
- 9.10.3 Condition of the MRCP-D after test
- 9.11 Verification of the behaviour of the MRCP-D under short-circuit conditions [Go to Page]
- 9.11.1 List of the short-circuit tests
- Table 17 – Tests to be made to verify the behaviour of MRCP-Ds under short-circuit conditions [Go to Page]
- 9.11.2 Short-circuit tests [Go to Page]
- 9.11.2.1 General conditions for test
- Table 18 – Minimum values of l2t and lp
- Table 19 – Power factors for short-circuit tests [Go to Page]
- 9.11.2.2 Where applicable, the prospective short-circuit current shall be the average of the prospective currents in all the phases.Verification of the rated making and breaking capacity (Im)
- 9.11.2.3 Verification of the rated residual making and breaking capacity (IΔm) of MRCP-Ds
- 9.11.2.4 Verification of the coordination between the MRCP-D and the SCPD
- 9.12 Verification of resistance to mechanical shock and impact [Go to Page]
- 9.12.1 Mechanical shock [Go to Page]
- 9.12.1.1 Test device
- 9.12.1.2 Test procedure
- 9.12.2 Mechanical impact [Go to Page]
- 9.12.2.3 Plug-in type MRCP-Ds
- 9.13 Test of resistance to heat
- 9.14 Test of resistance to abnormal heat and to fire
- 9.15 Verification of the trip-free mechanism [Go to Page]
- 9.15.1 General test conditions
- 9.15.2 Test procedure
- 9.16 Verification of the operation of the test device at the limits of rated voltage
- 9.17 Verification of the behaviour of MRCP-Ds functionally dependent on line voltage, classified under 4.1.2.1, in case of failure of the line voltage [Go to Page]
- 9.17.1 Determination of the limiting value of the line voltage (Ux)
- 9.17.2 Verification of the behaviour in case of failure of the line voltage
- 9.17.3 Verification of the correct operation, in presence of a residual current, for RCCBs opening with delay in case of failure of the line voltage
- 9.17.4 Verification of the correct operation of MRCP-Ds with three or four current poles, in presence of a residual current, the neutral and one line terminal only being energized
- 9.18 Verification of limiting values of the non-operating current under overcurrent conditions [Go to Page]
- 9.18.1 Verification of the limiting value of overcurrent in case of a load through a MRCP-D with two current poles
- 9.18.2 Verification of the limiting value of overcurrent in case of a single phase load through a three-pole or four-pole MRCP-D
- 9.19 Verification of behaviour of MRCP-Ds in case of current surges caused by impulse voltages [Go to Page]
- 9.19.1 Current surge test for all MRCP-Ds (0,5 μs/100 kHz ring wave test)
- 9.19.2 Verification of behaviour at surge currents up to 3 000 A (8/20 µs surge current test) [Go to Page]
- 9.19.2.1 Test conditions
- 9.19.2.2 Test results
- 9.20 Verification of resistance of the insulation against an impulse voltage
- 9.21 Verification of the correct operation at residual currents with d.c. components [Go to Page]
- 9.21.1 Type A residual current devices [Go to Page]
- 9.21.1.1 Verification of the correct operation in case of a continuous rise of the residual pulsating direct current
- Table 20 – Tripping current ranges for type A MRCP-Ds [Go to Page]
- 9.21.1.2 Verification of the correct operation in case of suddenly appearing residual pulsating direct currents
- 9.21.1.3 Verification at the reference temperature of the correct operation with load
- 9.21.1.4 Verification of the correct operation in case of residual pulsating direct currents superimposed by smooth direct current of 0,006 A
- 9.22 Verification of reliability [Go to Page]
- 9.22.1 Climatic test [Go to Page]
- 9.22.1.1 Test chamber
- 9.22.1.2 Severity
- 9.22.1.3 Testing procedure
- 9.22.1.4 Recovery
- 9.22.1.5 Final verification
- 9.22.2 Test with temperature of 40 C
- 9.23 Verification of ageing
- 9.24 Electromagnetic Compatibility (EMC)
- Table 21 – Tests to be applied for EMC
- Figure 1 – Thread forming tapping screw (3.6.10)
- Figure 2 – Thread cutting tapping screw (3.6.11)
- Figure 3 – Standard test finger (9.6)
- Figure 4–behaviour at low ambient air temperature of MRCP-Ds for use in the range of −25 C to +40 C (9.25)
- Figure 5 – Test circuit for the verification of the correct operation of MRCP-Ds in the case of residual pulsating direct currents
- Figure 6 – Test circuit for the verification of the correct operation in case of residual pulsating direct currents in presence of a standing smooth direct current of 0,006 A
- Figure 7 – Test circuit for the verification of the rated residual making and breaking capacity (IΔm)
- Figure 12 – Test circuit for the verification of the rated making and breaking capacity and of the co-ordination with a SCPD of a two-pole 400V, three-pole or four-pole MRCP-D (9.11)
- Figure 13 – Test apparatus for the verification of the minimum I2t and Ip values to be withstood by the MRCP-D (9.11.2.1 a))
- Figure 14 – Mechanical shock test apparatus (9.12.1)
- Figure 15 – Mechanical impact test apparatus (9.12.2.1)
- Figure 16 – Striking element for pendulum impact test apparatus (9.12.2.1)
- Figure 17 – Mounting support for sample for mechanical impact test (9.12.2.1)
- Figure 18 – Example of mounting and unenclosed MRCP-D for mechanical impact test (9.12.2.1)
- Figure 19 – Example of mounting of panel mounting type MRCP-D for the mechanical impact test (9.21.2.1)
- Figure 20 – Application of force for mechanical test of rail mounted MRCP-D (9.12.2.2)
- Figure 21 – Ball-pressure test apparatus (9.13.2)
- Figure 22 – Test circuit for the verification of the limiting value of overcurrent in case of single-phase load through a three-pole MRCP-D (9.18.2)
- Figure 23 – Current ring wave 0,5 μs/100 kHz
- Figure 24 – Test circuit for the ring wave test at MRCP-Ds
- Figure 25 – Stabilising period for reliability test (9.22.1.3)
- Figure 26 – Reliability test cycle (9.22.1.3)
- Figure 27 – Example for test circuit for verification of ageing (9.23)
- Figure 28 – Surge current impulse 8/20 μs
- Figure 29 – Test circuit for the surge current test at MRCP-Ds
- Figure 30 – Example of calibration record for short-circuit test (9.11.2.1 j2)
- Figure 31 – Example of application of force for mechanical test on two-pole plug-in MRCP-D, the holding in position of which depends solely on the plug-in connections (9.12.2.3)
- Figure 32 – Diagrammatic representation of a small part
- Figure 33 – Test cycle for low temperature test (9.25)
- Annex A (normative) Test sequence and number of samples to be submitted for verification of conformity
- A.1 Test sequences
- Table A.1 – Test sequences
- A.2 Number of samples to be submitted for full test procedure
- Table A.2 - Number of samples for full test procedure
- A.3 Number of samples to be submitted for simplified test procedures in case of submitting simultaneously a range of MRCP-Ds of the same fundamental design
- Table A.3 - Number of samples for simplified test procedure
- Table A.4 – Test sequences for MRCP-Ds of different classification according to 4.6
- Annex B (normative) Determination of clearances and creepage distances
- Figures B.1 to B.10 – Illustrations of the application of creepage distances
- Annex C (normative) Arrangement for the detection of the emission of ionized gases during short-circuit tests
- Figure C.1 – Test arrangement
- Figure C.2 – Grid
- Figure C.3 – Grid circuit
- Annex D (normative) Routine tests
- D.1 General
- D.2 Tripping test
- D.3 Electric strength test
- D.4 Performance of the test device
- Annex E (informative) Methods of determination of short-circuit power-factor
- E.1 The formula for the d.c. component is:
- E.2 Determine the angle from:
- Annex F (informative) Glossary of symbols
- Annex G (informative) Examples of terminal designs
- Figure G.1 – Examples of pillar terminals
- Figure G.2 – Examples of screw terminals and stud terminals
- Figure G.3 – Examples of saddle terminals
- Figure G.4 – Examples of lug terminals
- Annex H (informative) Follow-up testing programme for MRCP-Ds
- H.1 General
- H.2 Follow-up testing programme
- H.2.1 Quarterly follow-up testing programme
- H.2.2 Annual follow-up testing programme
- Table H.1 – Test sequences during follow-up inspections
- H.2.3 Sampling procedure
- H.2.3.1 Quarterly testing programme
- H.2.3.2 Annual testing programme
- H.2.4 Number of samples to be tested
- Table H.2 – Number of samples to be tested
- Annex I (informative) SCPDs for short-circuit tests
- I.1 Introduction
- I.2 Silver wires
- Table I.1 – Indication of silver wire diameters as a function of rated currents and short-circuit currents
- I.3 Fuses
- I.4 Other means
- Annex J (normative) Particular requirements for MRCP-Ds with screwless type terminals for external copper conductors
- J.1 Scope
- J.2 Normative references
- J.3 Definitions
- J.4 Classification
- J.5 Characteristics of MRCP-Ds
- J.6 Marking
- J.7 Standard conditions for operation in service
- J.8 Constructional requirements
- J.8.1 Connection or disconnection of conductors
- J.8.2 Dimensions of connectable conductors
- Table J.1 – Connectable conductors
- J.8.3 Connectable cross-sectional areas
- Table J.2 – Cross-sections of copper conductors connectable to screwless-type terminals
- J.8.4 Insertion and disconnection of conductors
- J.8.5 Design and construction of terminals
- J.8.6 Resistance to ageing
- J.9. Tests
- J.9.1 Test of reliability of screwless terminals
- J.9.1.1 Reliability of screwless system
- J.9.1.2 Test of reliability of connection
- J.9.2 Tests of reliability of terminals for external conductors: mechanical strength
- Table J.3 – Pull forces
- J.9.3 Cycling test
- Figure J.1 – Connecting samples
- Figure J.2 – Examples of screwless-type terminals
- Annex ZZ (informative) Coverage of Essential Requirements of EU directives
- Bibliography [Go to Page]
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