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eLibrary > BS EN IEC 60079-11:2024 - TC Tracked Changes. Explosive atmospheres - Equipment protection by intrinsic safety \\\"i\\\" >

BS EN IEC 60079-11:2024 - TC Tracked Changes. Explosive atmospheres - Equipment protection by intrinsic safety \\\"i\\\", 2024

30363233.pdf [Go to Page]
National foreword [Go to Page]
Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
CONTENTS
FOREWORD
1 Scope
Tables [Go to Page]
Table 1 – Applicability of specific clauses of IEC 60079-0
2 Normative references
3 Terms, definitions and abbreviated terms [Go to Page]
3.1 Terms and definitions
3.2 Abbreviated terms
4 Equipment grouping, classification and Levels of Protection of apparatus [Go to Page]
Table 2 – List of abbreviated terms used
5 Ignition compliance requirements [Go to Page]
5.1 General
5.2 Conditions for assessment [Go to Page]
5.2.1 General
5.2.2 Level of Protection "ia"
5.2.3 Level of Protection "ib"
5.2.4 Level of Protection "ic"
5.2.5 Non-shock hazard equipment or systems
5.3 Spark ignition compliance [Go to Page]
5.3.1 General
5.3.2 Levels of Protection "ia" and "ib"
5.3.3 Level of Protection "ic"
5.3.4 Application of safety factors
5.3.5 Circuits without controlled semiconductor limitation
5.3.6 Circuits with controlled semiconductor limitation
5.4 Thermal ignition compliance [Go to Page]
5.4.1 General
5.4.2 Temperature of small components for Group I and Group II
5.4.3 Wiring within intrinsically safe apparatus for Group I and Group II
5.4.4 PCB tracks for Group I and Group II
Table 3 – Temperature classification of copper wiringfor ambient temperature ≤ 40 °C
Table 4 – Temperature classification of tracks on PCBs [Go to Page]
5.4.5 Intrinsically safe apparatus and component temperature for dusts
5.5 Simple apparatus
Table 5 – Maximum permitted power dissipation within a component immersed in dust
6 Apparatus construction [Go to Page]
6.1 General
6.2 Enclosures [Go to Page]
6.2.1 General
6.2.2 Apparatus complying with Table 7
6.2.3 Apparatus complying with Table 8 or Table 9
6.2.4 Enclosures for Group IIIC intrinsically safe apparatus
6.2.5 Protection of separations
6.3 Connection facilities for external circuits [Go to Page]
6.3.1 Terminals
Figures [Go to Page]
Figure 1 – Separation at terminals [Go to Page]
6.3.2 Earth Terminals
6.3.3 Plugs and sockets
6.3.4 Permanently connected cable
6.3.5 Connections and accessories for intrinsically safe apparatus for use in non-hazardous area
6.4 Internal connections and connectors [Go to Page]
6.4.1 General
6.4.2 Infallible connections
Figure 2 – Examples of independent and non-independent connecting elements [Go to Page]
6.4.3 Connectors for internal connections, plug-in cards and components
6.4.4 Earth conductors and connections
Table 6 – Requirements for infallible circuit board tracks and vias
6.5 Separation of conductive parts [Go to Page]
6.5.1 Separations on which intrinsic safety depends
6.5.2 Separation distances according to Table 7
6.5.3 Reduced separation distances
6.5.4 Failure of separations
Table 7 – Clearances, creepage distances and separations
Table 8 – Reduced separations
Table 9 – Reduced separations for Level of Protection "ic"
Figure 3 – Example of separation of conductive parts [Go to Page]
6.5.5 Voltage between conductive parts
6.5.6 Types of separation
Table 10 – Creepage distance and clearance X in Figure 4
Figure 4 – Determination of creepage distances and clearance [Go to Page]
6.5.7 Composite separations
6.5.8 Printed circuit board assemblies
Figure 5 – Creepage distances and clearances on PCBAs [Go to Page]
6.5.9 Separation by metal parts
6.5.10 Separation by non-metallic insulating partitions
6.5.11 Insulation of internal wiring
6.6 Encapsulation [Go to Page]
6.6.1 General
6.6.2 Encapsulation used for the exclusion of explosive atmospheres
Figure 6 – Encapsulation used without a separate external enclosure
Figure 7 – Complete enclosure with no user removable covers or openings
Figure 8 – Enclosure where the compound forms one of the external walls
Figure 9 – Enclosure with cover [Go to Page]
6.6.3 Mechanical protection to avoid access to parts
Figure 10 – Moulding over un-mounted components
Figure 11 – Moulding over components mounted on a PCB [Go to Page]
6.6.4 Encapsulation used for protection of a fuse
6.6.5 Encapsulation used to provide separation
6.6.6 Encapsulation used to enhance the rating of protective components
6.6.7 Free space within the encapsulation
Table 11 – Minimum thickness of compound adjacentto individual free space for Group I and Group II
Table 12 – Minimum thickness of compound adjacentto individual free space for Group III
6.7 Specification of coating, encapsulation materials
6.8 Protection against polarity reversal
6.9 Dielectric strength requirement
7 Characteristics and failure of components and assemblies [Go to Page]
7.1 Rating of components on which intrinsic safety depends
7.2 Failure of components
7.3 Manufacturing variation
7.4 Resistors [Go to Page]
7.4.1 General
7.4.2 Resistors on which intrinsic safety depends
Table 13 – Rating and failure modes of resistors
7.5 Capacitors [Go to Page]
7.5.1 General
7.5.2 Capacitors on which intrinsic safety depends
7.5.3 Blocking capacitors
7.5.4 Infallible filter capacitors
Table 14 – Rating and failure modes of capacitors
7.6 Inductors and windings [Go to Page]
7.6.1 General
7.6.2 Inductors on which intrinsic safety depends
7.6.3 Infallibly insulated inductors
Table 15 – Rating and failure modes of inductors [Go to Page]
7.6.4 Damping windings
7.6.5 Common mode choke coils (EMI suppression filters)
7.7 Semiconductors [Go to Page]
7.7.1 Failure of semiconductors
7.7.2 Semiconductors on which intrinsic safety depends
7.7.3 Transient effects on semiconductors on which intrinsic safety depends
7.7.4 Semiconductors in shunt voltage limiters
Table 16 – Rating and failure modes of semiconductors [Go to Page]
7.7.5 Shunt assembly on which intrinsic safety depends
7.7.6 Safety assemblies infallible against failure to limit voltage
7.7.7 Semiconductor current limiters
7.7.8 Use of programmable components
7.8 Transformers [Go to Page]
7.8.1 General
7.8.2 Transformers on which intrinsic safety depends
7.8.3 Construction of transformers on which intrinsic safety depends
7.8.4 Protective measures for transformers on which intrinsic safety depends for Levels of Protection "ia" and "ib"
Table 17 – Minimum foil thickness or minimum wire diameter of the screen [Go to Page]
7.8.5 Requirements for transformers for Level of Protection "ic"
7.9 Relays [Go to Page]
7.9.1 General
7.9.2 Relays on which intrinsic safety depends
7.10 Signal isolators [Go to Page]
7.10.1 General
7.10.2 Signal isolators on which intrinsic safety depends
Table 18 – Rating and failure modes of signal isolators [Go to Page]
7.10.3 Signal isolators between intrinsically safe and non-intrinsically safe circuits
7.10.4 Signal isolators between separate intrinsically safe circuits
7.11 Fuses
7.12 Primary and secondary cells and batteries [Go to Page]
7.12.1 General
7.12.2 Construction of cells and batteries used in intrinsically safe apparatus
7.12.3 Electrolyte leakage
7.12.4 Ventilation
7.12.5 Cell voltages
7.12.6 Batteries in equipment protected by different Types of Protection
7.12.7 Batteries used and replaced in explosive atmospheres
7.12.8 Replaceable batteries used but not replaced in explosive atmospheres
7.12.9 External contacts for charging batteries
7.13 Piezoelectric devices
7.14 Cells for the detection of gases [Go to Page]
7.14.1 Electrochemical
7.14.2 Catalytic
7.15 Supercapacitors
7.16 Thermal devices [Go to Page]
7.16.1 General
7.16.2 Thermal devices used to limit temperature
Table 19 – Rating and failure modes of temperature sensors [Go to Page]
7.16.3 PPTC devices used to limit current
Table 20 – Rating and failure modes of switching thermal devices
Table 21 – Rating and failure modes of PTC devices used to limit temperature
Table 22 – Rating and failure modes of PPTC devices used to limit current
7.17 Mechanical switches
8 Supplementary requirements for specific apparatus [Go to Page]
8.1 Diode safety barriers [Go to Page]
8.1.1 General
8.1.2 Construction
8.2 FISCO apparatus
9 Type verifications and type tests [Go to Page]
9.1 Spark ignition test [Go to Page]
9.1.1 General
9.1.2 Spark test apparatus and its use
9.1.3 Test gas mixtures and spark test apparatus calibration current
Table 23 – Compositions of explosive test mixtures adequate for 1,0 safety factor
Table 24 – Compositions of explosive test mixtures adequate for 1,5 safety factor
9.2 Spark ignition assessment using reference curves and tables [Go to Page]
9.2.1 General
9.2.2 Assessment of simple resistive circuit
Figure 12 – Example of a simple resistive circuit [Go to Page]
9.2.3 Assessment of simple capacitive circuits
Figure 13 – Example of simple capacitive circuit
Figure 14 – Effective capacitance [Go to Page]
9.2.4 Assessment of Simple Inductive Circuits
Figure 15 – Example of simple inductive circuit
Table 25 – Permitted reduction of effective capacitancewhen protected by a series resistance [Go to Page]
9.2.5 Determination of Lo/Ro for resistance limited power source
9.2.6 Circuits with both inductance and capacitance
9.3 Temperature tests
9.4 Mechanical tests [Go to Page]
9.4.1 Casting compound
9.4.2 Acceptability of encapsulated or coated fuses
9.4.3 Partitions
9.4.4 Cable pull test
9.5 Current carrying capacity of infallible printed circuit board connections
9.6 Dielectric strength tests
9.7 Qualification of solid insulation and distance through casting compound for application of reduced separations [Go to Page]
9.7.1 General
9.7.2 Preconditioning
9.7.3 AC power frequency voltage test
9.7.4 Partial discharge test
9.8 Type tests for PCB coatings
9.9 Differential Leakage current tests for signal isolators
Figure 16 – Test voltages
9.10 Isolator tests [Go to Page]
9.10.1 General
9.10.2 Thermal conditioning and dielectric test
Figure 17 – Recommended bias circuit for Differential Leakage measurement [Go to Page]
9.10.3 Dielectric and short circuit test
9.11 Tests for intrinsically safe apparatus containing piezoelectric devices
9.12 Tests for PTC devices
9.13 Determination of parameters of loosely specified components
9.14 Tests for cells, batteries and supercapacitors [Go to Page]
9.14.1 Conditions for testing
9.14.2 Electrolyte leakage test for cells, batteries and supercapacitors
9.14.3 Spark ignition and surface temperature of cells, batteries or supercapacitors
9.14.4 Battery container pressure tests
9.14.5 Battery resistance
9.15 Determination of storable energy in common mode chokes
Figure 18 – Inductor test circuit
9.16 Type tests for components protected by time dependent current limitation
Figure 19 – Measured oscillation
9.17 Transformer tests [Go to Page]
9.17.1 General
9.17.2 Mains transformers for Level of Protection "ia" and "ib"
9.17.3 Transformers galvanically isolated from the mains supply for Levels of Protection "ia" and "ib"
9.17.4 Transformers for Level of Protection "ic"
10 Routine verifications and tests [Go to Page]
10.1 Alternative reduced spacings
10.2 Routine tests for diode safety barriers [Go to Page]
10.2.1 Completed barriers
10.2.2 Diodes for 2-diode "ia" barriers
10.3 Routine tests for transformers [Go to Page]
10.3.1 Levels of Protection "ia" and "ib"
10.3.2 Level of Protection "ic"
10.4 Routine verification of conformal coating and encapsulation
Table 26 – Routine test voltages for transformers
11 Marking [Go to Page]
11.1 Intrinsically safe apparatus and associated apparatus [Go to Page]
11.1.1 General
11.1.2 Intrinsic safety parameters
11.1.3 FISCO
11.1.4 Marking of connection facilities
11.1.5 Non-hazardous area accessory
11.2 Warning markings
Table 27 – Text of warning markings
12 Instructions [Go to Page]
12.1 General
12.2 Specific Conditions of Use
Table 28 – Concerns addressed by Specific Conditions of Use
Annex A (normative)Spark ignition reference curves [Go to Page]
Figure A.1 – Resistive circuits
Figure A.2 – Group I capacitive circuits
Figure A.3 – Group II capacitive circuits
Figure A.4 – Inductive circuits of Group II
Figure A.5 – Group I inductive circuits
Figure A.6 – Group IIC inductive circuits
Table A.1 – Permitted short circuit current correspondingto the voltage and the equipment group
Table A.2 – Permitted capacitance corresponding to the voltageand the equipment group
Annex B (normative)Spark test apparatus for intrinsically safe circuits [Go to Page]
B.1 Principle
B.2 Spark test apparatus
B.3 Spark test apparatus sensitivity
B.4 Preparation and cleaning of tungsten wires
B.5 Conditioning a new cadmium disc
B.6 Limitations of the spark test apparatus
B.7 Modification of spark test apparatus for use at higher currents
Figure B.1 – Spark test apparatus for intrinsically safe circuits
Figure B.2 – Cadmium contact disc
Figure B.3 – Wire holder
Figure B.4 – Example of a practical design of spark test apparatus
Figure B.5 – Arrangement for fusing tungsten wires
Annex C (informative)Measurement of creepage distances, clearances and separation distances through casting compound and through solid insulation [Go to Page]
C.1 Clearances and separation distances through casting compound andthrough solid insulation
Figure C.1 – Measurement of clearance
Figure C.2 – Measurement of composite distances
C.2 Creepage distances
Figure C.3 – Measurement of creepage
C.3 Examples for the application of an ambient pressure correction factor
Figure C.4 – Composite separation including creepage
Figure C.5 – PCB with two coated components designedfor ambient pressure 60 kPa to 110 kPa
Figure C.6 – PCB with 3 mm slot designed for ambient pressure 60 kPa to 110 kPa
Annex D (normative)Excess transient energy test [Go to Page]
D.1 Overview
Table D.1 – Energy limits by equipment group
D.2 Circuit configuration
Figure D.1 – Example circuit configuration
D.3 Test equipment
D.4 Test load
D.5 Supply voltage
D.6 Supply change tests
D.7 Load change tests
D.8 Transient energy calculation
Figure D.2 – Example output voltage, current, power and energy measuredduring a load transient
Annex E (normative)FISCO – Apparatus requirements [Go to Page]
E.1 Overview
E.2 Apparatus requirements [Go to Page]
E.2.1 General
E.2.2 FISCO power supplies
E.3 FISCO field devices [Go to Page]
E.3.1 General
Table E.1 – Assessment of maximum output current for usewith "ia" and "ib" FISCO rectangular supplies
Table E.2 – Assessment of maximum output current for use with "ic" FISCO rectangular supplies [Go to Page]
E.3.2 Additional requirements of "ia" and "ib" FISCO field devices
E.3.3 Additional requirement of "ic" FISCO field devices
E.3.4 Terminator
E.3.5 Simple apparatus
Figure E.1 – Typical FISCO system
Annex F (normative)Ignition testing of semiconductor limiting power supply circuits [Go to Page]
F.1 Overview
F.2 Initial test
F.3 Subsequent tests
F.4 Examples of pass and fail
Table F.1 – Terms used in Annex F
Table F.2 – Sequence of tests
Table F.3 – Safety factor provided by several explosive test mixturesthat may be used for the tests in Table F.2
Table F.4 – Example of a Group I circuit with characteristics described by 'Pr – Table F.4 – PASS' of Figure F.1
Table F.5 – Example of a Group I circuit with characteristics described by 'Pr – Table F.5 – FAIL' of Figure F.1
Figure F.1 – Safety factor vs ignition probability
Annex G (normative)Universal output characteristics [Go to Page]
G.1 Overview
G.2 Linear source
G.3 Non-linear source
G.4 Curves
Figure G.1 – Example of an output characteristic for Group IIC
Figure G.2 – Limit curve diagram for universal source characteristic − Group IIC
Figure G.3 – Limit curve diagram for universal source characteristic – Group IIB
Annex H (informative)Examples of marking [Go to Page]
H.1 General
H.2 Self-contained intrinsically safe apparatus
H.3 Intrinsically safe apparatus supplied by other intrinsically safe circuits
H.4 Associated apparatus
H.5 Associated apparatus protected by a flameproof enclosure
H.6 Intrinsically safe apparatus Level of Protection "ic"
H.7 Intrinsically safe apparatus Level of Protection "ib" with "ia"' outputs
H.8 FISCO [Go to Page]
H.8.1 Power supply
H.8.2 Field device
H.8.3 Terminator
H.8.4 Dual marked field device
Annex I (informative)Overview of tests on enclosures or parts of enclosures [Go to Page]
Figure I.1 – Tests for enclosures or parts of enclosuresfor separation distances complying with Table 7
Figure I.2 – Tests for enclosures or parts of enclosures for separation distances complying with Table 8 or Table 9
Bibliography [Go to Page]

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