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BS EN IEC 60352-2:2024 - TC Tracked Changes. Solderless connections - Crimped connections. General requirements, test methods and practical guidance, 2024
- 30437443.pdf [Go to Page]
- National foreword [Go to Page]
- Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
- Blank Page
- English [Go to Page]
- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- Figures [Go to Page]
- Figure 1 – Examples of crimp contact
- Figure 2 – Examples of splice
- Figure 3 – Example of insulation support
- Figure 4 – Examples of insulation grip
- Figure 5 – Examples of crimping tool
- Figure 6 – Example of positioner holding the crimp barrel
- Figure 7 – Example of positioner holding the stripped wire
- Figure 8 – Open crimp barrel
- Figure 9 – Closed crimp barrels
- Figure 10 – Pre-insulated crimp barrel
- Figure 11 – Crimping zones
- Figure 12 – Example of crimp funnel
- 4 Workmanship
- 5 Prerequisites for basic test schedule [Go to Page]
- 5.1 Classification by end-product class [Go to Page]
- 5.1.1 General
- 5.1.2 Class A – General electrical and electronics products
- 5.1.3 Class B – Dedicated service electrical and electronics products
- 5.1.4 Class C – High-performance electrical and electronics products
- 5.2 Prerequisites for tools
- 5.3 Prerequisites for crimp barrels [Go to Page]
- 5.3.1 Crimp barrel materials
- 5.3.2 Crimp barrel dimensions
- 5.3.3 Crimp barrel surface finishes
- 5.3.4 Crimp barrel design features
- 5.4 Prerequisites for wires [Go to Page]
- 5.4.1 General
- 5.4.2 Conductor materials
- 5.4.3 Conductor dimensions
- 5.4.4 Conductor surface finishes
- 5.4.5 Wire insulation
- 5.4.6 Wire cutting and stripping
- Figure 13 – Concentricity of wire insulation
- Tables [Go to Page]
- Table 1 – Allowable strand damage
- 5.5 Prerequisites for crimped connections [Go to Page]
- 5.5.1 Compatibility of combination
- 5.5.2 Conductor location
- 5.5.3 Crimping location
- 5.5.4 Contact deformation
- 5.5.5 Prerequisites for crimped connections with more than one conductor in the crimp barrel
- 5.5.6 Adjustment of conductor cross-sectional area to the crimp barrel
- 5.5.7 Crimp contacts and terminal ends
- Figure 14 – Diameter ratio when crimping wires with different individual strand diameters
- Figure 15 – Examples of open stamped crimp contacts for automatic production
- Figure 16 – Stamped open B-crimp contact with anvil and punch shapes
- Figure 17 – Designations on open B-crimp contact
- Figure 18 – Examples of crimping dies (press dies)
- Figure 19 – Stamped closed crimp barrel (crimp cable lug)
- Figure 20 – Different crimp shapes
- Figure 21 – Examples of crimping dies for closed crimp barrels
- Figure 22 – Tubular cable lugs for class 5 conductors
- Figure 23 – Tubular cable lugs for class 6 conductors
- Figure 24 – Crimping process of 4-indent crimping with adjustable tools [Go to Page]
- 5.5.8 Splice crimp barrels
- Figure 25 – Pre-insulated stamped close crimp barrel, area definitions
- Figure 26 – Pre-insulated closed crimp barrels of various designs
- Figure 27 – Examples of pre-insulated crimp cable lugs as strip parts
- 5.6 Prerequisites for splice crimped connections [Go to Page]
- 5.6.1 General
- 5.6.2 Conductor requirements for crimped splices
- Figure 28 – Uninsulated splice variants
- 6 Testing [Go to Page]
- 6.1 General
- Figure 29 – Diameter ratio when crimping wires with different individual strand diameters in splices
- Table 2 – Prerequisites of 5.3 for crimp barrels to access the basic test schedule of 8.2
- 6.2 Standard conditions for testing
- 6.3 Pre-conditioning
- 6.4 Recovery
- 6.5 Mounting of the specimen
- Table 3 – Prerequisites of 5.4 for wires to access the basic test schedule of 8.2
- 7 Test methods and test requirements [Go to Page]
- 7.1 General examination of crimp barrels and wires
- 7.2 Examination of crimp dimensions [Go to Page]
- 7.2.1 Crimp height Ch, crimp width Cw and measurable crimp width Cwm
- Table 4 – Magnification aids for visual examination
- Figure 30 – Crimp height measurement on open crimp barrel (B-crimp)
- Figure 31 – Crimp height measurement on closed crimp barrel (mandrel crimping) [Go to Page]
- 7.2.2 Contact deformation after crimping
- Figure 32 – Crimp height measurement on closed crimp barrel (4-indent crimping)
- Table 5 – Example of permissible tolerances for crimp height measurements [Go to Page]
- 7.2.3 Visual examination of insulation distance and conductor overhang
- Figure 33 – Example of holding and measuring points for contact deformation
- Figure 34 – Insulation distance and conductor overhang [Go to Page]
- 7.2.4 Visual examination of splice crimped connections
- 7.2.5 Visual examination of crimped connections on closed (machined) crimp barrels
- 7.2.6 Visual examination of crimped connections on B-crimp open crimp barrels
- 7.2.7 Visual examination of crimped connections with open crimp barrel with insulation grip
- Table 6 – Insulation distance and conductor overhang on closed crimp barrels
- Figure 35 – Examples of insulation grip die shapes
- Figure 36 – Examples of insulation grip
- 7.3 Mechanical tests [Go to Page]
- 7.3.1 Tensile strength
- Table 7 – Pull-out force of crimped connections [Go to Page]
- 7.3.2 Microsection
- 7.3.3 Insulation grip effectiveness
- 7.3.4 Bending test (uninsulated crimp barrels with insulation grip)
- Figure 37 – Test arrangement
- Figure 38 – Bending test of crimped connections with uninsulated crimp barrels [Go to Page]
- 7.3.5 Bending test (pre-insulated crimp barrels with insulation grip)
- Figure 39 – Bending test of crimped connections with pre-insulated crimp barrels [Go to Page]
- 7.3.6 Bending test on splice crimped connections
- 7.3.7 Vibration test
- Figure 40 – Bending test on splice crimped connections
- 7.4 Electrical tests [Go to Page]
- 7.4.1 Crimp resistance
- Figure 41 – Arrangement for vibration test
- Table 8 – Vibration, preferred test severities
- Figure 42 – Test arrangement for measurement of crimp resistance of single-conductor crimped connection
- Figure 43 – Measuring of crimp resistance of splices or multiple-conductor crimp connections
- Figure 44 – Crimp resistance RC of crimped connections with copper barrels and copper conductor (K = 1)
- Table 9 – Example of other materials [Go to Page]
- 7.4.2 Voltage proof (crimped connection with pre-insulated crimp barrels)
- 7.4.3 Current-carrying capacity test with temperature rise
- Figure 45 – Test setup for temperature rise measurements under current load
- Table 10 – Minimum wire length L as a function of conductor cross-sectional area S
- 7.5 Climatic tests [Go to Page]
- 7.5.1 General
- 7.5.2 Rapid change of temperature
- Figure 46 – Temperature chamber with ventilation opening for current-temperature derating measurements [Go to Page]
- 7.5.3 Dry heat
- 7.5.4 Climatic sequence
- 7.5.5 Current loading, cyclic
- Figure 47 – Examples of test arrangements
- Figure 48 – Test current for crimped connections [Go to Page]
- 7.5.6 Crimping at low temperature (crimped connections with pre-insulated crimp barrels)
- Table 11 – Current values (tentative) – alternative current loading, cyclic method
- 7.6 Miscellaneous tests [Go to Page]
- 7.6.1 Fluid resistance of pre-insulated crimp barrels
- 7.6.2 Flowing mixed gas corrosion test
- 8 Test schedules [Go to Page]
- 8.1 Preparation and type of test specimens [Go to Page]
- 8.1.1 Preparation of test specimens
- 8.1.2 Type A specimen (for testing according to 8.2, 8.2.3.3 if required, 8.3.2, 8.3.4 if required)
- 8.1.3 Type B specimen (for tests according to 8.2.3.1 and 8.3.3.2)
- Figure 49 – Examples of type A specimens [Go to Page]
- 8.1.4 Type C specimen (for insulation grip effectiveness tests, see 8.2.3.3 and 8.3.4)
- Figure 50 – Examples of type B specimens [Go to Page]
- 8.1.5 Type D specimen (for testing of pre-insulated crimp barrels only, see 8.2.3.4, 8.3.9.2 and 8.3.9.3)
- 8.1.6 Type E specimen (for tests according to 8.2.3.2, 8.2.3.4, 8.3.3.5)
- Figure 51 – Examples of type C specimens
- Figure 52 – Example of type D specimen (pre-insulated) [Go to Page]
- 8.1.7 Type F specimen (for testing of pre-insulated crimp barrels according to 8.3.9.4)
- Figure 53 – Examples of type E specimen [Go to Page]
- 8.1.8 Type G specimen (for testing according to 8.2.3.2, 8.3.3.4, 8.3.3.5 and 8.3.6)
- 8.1.9 Type H specimen (for testing according to 8.2.2, 8.2.3.1, 8.2.3.3, 8.3.2, 8.3.3.2, 8.3.3.3 and 8.3.4)
- Figure 54 – Example of type F specimen
- Figure 55 – Type G specimen (splice) [Go to Page]
- 8.1.10 Number of specimens required
- Figure 56 – Type H specimen (splice)
- Table 12 – Number of specimens
- 8.2 Basic test schedule [Go to Page]
- 8.2.1 General
- 8.2.2 Initial examination
- 8.2.3 Testing of crimped connections
- Table 13 – Test group B0
- Table 14 – Test group B1
- Table 15 – Test group B2
- Table 16 – Test group B3
- 8.3 Full test schedule [Go to Page]
- 8.3.1 General
- Table 17 – Test group B4
- Table 18 – Test group B5 [Go to Page]
- 8.3.2 Initial examination
- 8.3.3 Testing of crimped connections
- Table 19 – Test group F0
- Table 20 – Test group F1
- Table 21 – Test group F2
- Table 22 – Test group F3 [Go to Page]
- 8.3.4 Testing of insulation grip effectiveness, test group F5
- Table 23 – Test group F4
- Table 24 – Test group F5 [Go to Page]
- 8.3.5 Testing of stability of splice crimped connections under bending
- 8.3.6 Test group F7, if required
- 8.3.7 Test group F8, if required
- 8.3.8 Test group F9, if required
- Table 25 – Test group F6
- Table 26 – Test group F7
- Table 27 – Test group F8 [Go to Page]
- 8.3.9 Testing of crimped connections with pre-insulated crimp barrels
- Table 28 – Test group F9
- Table 29 – Test group F10
- 8.4 Flow charts
- Table 30 – Test group F11
- Table 31 – Test group F12
- Figure 57 – Basic test schedule (see 8.2)
- Figure 58 – Full test schedule (see 8.3)
- Annex A (informative) Practical guidance [Go to Page]
- A.1 General information on crimped connections [Go to Page]
- A.1.1 General
- A.1.2 Advantages of crimped connections
- A.1.3 Current-carrying capacity considerations
- A.2 Tool information
- A.3 Crimp barrel information [Go to Page]
- A.3.1 General
- Figure A.1 – Open crimp barrels [Go to Page]
- A.3.2 Materials
- A.3.3 Surface finishes
- A.3.4 Shapes of crimped connections
- Figure A.2 – Closed crimp barrels
- Figure A.3 – Crimping shape in the wire axis
- Figure A.4 – Crimping shape 90° angled to the wire axis
- Figure A.5 – Crimping shape without insulation grip
- A.4 Wire information [Go to Page]
- A.4.1 General
- Figure A.6 – Crimping shape with pre-insulated crimp barrel
- Figure A.7 – Crimping shape without pre-insulated crimp barrel [Go to Page]
- A.4.2 Conductor materials
- A.4.3 Conductor surface finishes
- A.4.4 Wire stripping information
- Figure A.8 – Crimped connections using solid round conductors
- Figure A.9 – Stripping length
- Table A.1 – Stripping of stranded conductors (good to sufficient requirements)
- A.5 Crimped connection information [Go to Page]
- A.5.1 General
- Table A.2 – Stripping of stranded conductors (faults or conditions according to Table 1) [Go to Page]
- A.5.2 Additional information
- Table A.3 – Condition of closed machined crimp barrels
- Table A.4 – Condition of open crimp barrels (B-crimp) [Go to Page]
- A.5.3 Crimped connections made with more than one wire in a crimp barrel
- Table A.5 – Minimum dimensions and tolerances for input funnel on a B-crimping zone
- Table A.6 – Condition of position of wire insulation in the insulation grip [Go to Page]
- A.5.4 Dimensions after crimping
- A.5.5 Conductor and crimp barrel materials and finishes selection
- A.6 Crimping process [Go to Page]
- A.6.1 Crimping of contacts with open crimp barrel
- A.6.2 Crimping of contacts with open crimp barrel, loose piece contacts
- A.6.3 Processing instruction
- Figure A.10 – Example of parallel (in-line) process crimping and angled crimping process
- A.7 Correct crimped connections (additional information) [Go to Page]
- A.7.1 Correct crimped connections of contacts with open crimp barrel
- Figure A.11 – Crimping process of an open crimp barrel (B-crimp)
- Figure A.12 – Correct crimped connections of contacts with open crimp barrel [Go to Page]
- A.7.2 Measuring of crimp height or depth
- Figure A.13 – Measuring instructions [Go to Page]
- A.7.3 Pull-out force
- Figure A.14 – Crimp height measuring procedure
- Figure A.15 – Pull-out force test for crimped connections with pull speed 50 mm/min
- Table A.7 – Pull-out force recommended minimum values for electrolytic copper conductors with tensile strength 200 N/mm2 (e.g. according to EN 13602)
- Figure A.16 – Determination of the intrinsic tensile strength of the conductor (50 mm/min)
- Table A.8 – Examples of pull-out force values (break) of commercially available European stranded conductors
- Table A.9 – Examples of pull-out force values (break) of commercially available American stranded conductors
- Table A.10 – Determination of the minimum pull-out forces in relation to the respective cross-sectional area and the intrinsic tensile strength of the conductor
- Figure A.17 – Relationships between crimp height (Ch), pull-out force, crimp force (indentation depth), and electrical conductivity
- A.8 Examination by microsection [Go to Page]
- A.8.1 Microsection image creation
- Figure A.18 – Pull-out force test of splice crimp connections (50 mm/min)
- Table A.11 – Pull-out force values for butt splice crimped connections [Go to Page]
- A.8.2 Graphical representation of the microsection image requirements
- Figure A.19 – Illustration of the parting plane on the crimp barrel centred in the crimping zone (X)
- Figure A.20 – Example of end-feed (length feed) open barrel crimp contacts
- Figure A.21 – Cutting the crimped connection [Go to Page]
- A.8.3 Microsection terminology
- Figure A.22 – Dimensions on the microsection for B-crimp barrels
- Figure A.23 – Dimensions on the microsection for closed tube and crimped cable lugs
- Figure A.24 – Dimensions on the microsection for 4-indent closed crimp barrels
- Figure A.25 – Dimensions on the microsection for hexagonal crimp barrels [Go to Page]
- A.8.4 Porosity ratio of crimped connections in microsections
- Figure A.26 – Dimensions on the microsection for crimp barrels (also pre-insulated)
- Figure A.27 – Examples of microsections of crimp barrels [Go to Page]
- A.8.5 Crimp compression ratio of the crimped connection in the microsection
- A.8.6 Ratio of crimp height to crimp width in the microsection
- Figure A.28 – Ratio of crimp height Ch to crimp width Cw [Go to Page]
- A.8.7 Requirements for B-crimped connections in the microsection
- Figure A.29 – Ratio of distance between crimp face ends CFE and base material thickness S
- Figure A.30 – Support angle αw of the crimp flanks
- Figure A.31 – Support height La of the crimp flanks
- Figure A.32 – Crimp edge distance to floor (Fa)
- Table A.12 – Values for the support height La [Go to Page]
- A.8.8 Condition of microsections
- Figure A.33 – Resulting bottom thickness Sb after crimping
- Figure A.34 – Requirements for the acceptance of a burr formation
- Table A.13 – Condition of microsections [Go to Page]
- A.8.9 Insulation grip
- Table A.14 – Condition "Good" of insulation grip for B-crimp and O-crimp (asymmetrical and symmetrical overlap and enclosure crimp)
- Table A.15 – Condition "PID" of insulation grip for B-crimp and O-crimp (asymmetrical and symmetrical overlap and enclosure crimp)
- Table A.16 – Condition "Fault" of insulation grip for B-crimp, O-crimp (asymmetrical and symmetrical overlap and enclosure crimp)
- A.9 Faults with crimped contacts having open crimp barrels
- A.10 Splices
- A.11 Crimp resistance test [Go to Page]
- A.11.1 General
- Table A.17 – Features of splice crimp barrels
- Figure A.35 – Diagrams for resistance values (A and B) for electrolytic copper conductors (K = 1) and for material with K = 3,8
- Figure A.36 – Replacement circuit diagram for the crimp resistance
- Table A.18 – Crimp resistance (maximum allowed initial values A) for K = 1 (electrolytic copper)
- Table A.19 – Crimp resistance (after loading, RCR) for K = 1 (electrolytic copper)
- Table A.20 – Crimp resistance (maximum allowed initial values A) for K ≈ 3,8 (nickel-brass, bright)
- Table A.21 – Crimp resistance (after loading, RCR) for K ≈ 3,8 (nickel-brass, bright)
- Table A.22 – Crimp resistance (maximum allowed initial values A) for K = 6,4 (tin-plated bronze)
- A.12 General information about crimp contacts as part of a multipole connector [Go to Page]
- A.12.1 Insertion of crimped contacts into the contact cavities of the connector insert
- Table A.23 – Crimp resistance (after loading, RCR) for K = 6,4 (tin-plated bronze) [Go to Page]
- A.12.2 Removal of inserted contacts
- A.12.3 Mounting and bending of wire bundles or cables with crimped contacts
- Figure A.37 – Insertion of crimped contacts into contact cavities
- Figure A.38 – Mounting of wire bundles/cables with crimped contacts [Go to Page]
- A.12.4 Mating and unmating of multipole connectors with crimped contacts
- A.13 Final remarks
- Figure A.39 – Bending of wire bundles of connectors
- Figure A.40 – Mating and unmating of multipole connectors
- Bibliography [Go to Page]