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BS EN IEC 62991:2025 Particular requirements for source switching equipment (SSE), 2025
- undefined
- European foreword
- Endorsement notice
- Annex ZA (normative) Normative references to international publications with their corresponding European publications
- Annex ZZ (informative) Relationship between this European standard and the safety objectives of Directive 2014/35/EU [2014 OJ L96] aimed to be covered
- Table ZZ.1 — Correspondence between this European standard and Annex I of Directive 2014/35/EU [2014 OJ L96] [Go to Page]
- English [Go to Page]
- CONTENTS
- FOREWORD
- INTRODUCTION
- Figures [Go to Page]
- Figure 1 – Energy efficiency management system (EEMS)
- Figure 2 – Principle of management of two sourceswith source switching equipment (SSE)
- 1 Scope
- 2 Normative references
- 3 Terms and definitions [Go to Page]
- 3.1 General definitions
- 3.2 Additional definitions for NC-SSE and SSE control units (controllers) of CSSE
- 3.3 Additional definitions dedicated to C-SSE
- 4 Classification [Go to Page]
- 4.1 According to the method of operation
- 4.2 According to the construction
- 4.3 According to the kind of current
- 4.4 According to the number of switched poles
- 4.5 According to the type of terminals
- 4.6 According to the SSE's intended application
- 4.7 According to coupling method [Go to Page]
- 4.7.1 SSE with synchronization
- 4.7.2 SSE with interlock
- 4.7.3 SSE with synchronization and interlock
- 4.8 According to the transition type
- 4.9 According to the possibility to select sources
- 4.10 According to the utilization category
- 4.11 According to the possibility to provide an OFF position
- 4.12 According to the method of mounting
- 4.13 According to the protection against external influences
- 4.14 According to functional categories
- Tables [Go to Page]
- Table 1 – Source switching functional categories
- Figure 3 – Example of A-SSE
- 5 Characteristics [Go to Page]
- 5.1 General
- Figure 4 – Example of R-SSE
- Figure 5 – Example of M-SSE
- 5.2 Type and characteristics of the equipment
- 5.3 Characteristics of NC-SSE [Go to Page]
- 5.3.1 General
- 5.3.2 Characteristics of main circuits
- Table 2 – Preferred values of rated voltages
- Table 3 – Rated impulse voltage as a function of the nominal voltageof the installation [Go to Page]
- 5.3.3 Utilization categories
- 5.3.4 Characteristics of control circuits, including electrical interlocks
- Table 4 – Utilization categories [Go to Page]
- 5.3.5 Characteristics of auxiliary circuits
- 5.4 Characteristics of C-SSE [Go to Page]
- 5.4.1 General
- 5.4.2 Characteristics of main circuits
- 5.4.3 Utilization categories
- 5.4.4 Characteristics of control circuits, including electrical interlocks
- 5.4.5 Characteristics of auxiliary circuits
- 6 Markings and product information [Go to Page]
- Table 5 – Requirements and position for markings and other product information
- 7 Standard conditions for operation in service [Go to Page]
- 7.1 General
- 7.2 Ambient temperature range in normal use
- 7.3 Relative humidity
- 7.4 Altitude
- 7.5 Conditions of installation
- 7.6 Pollution degree
- 8 Requirements for construction and operation [Go to Page]
- 8.1 General
- 8.2 Mechanical design [Go to Page]
- 8.2.1 General
- 8.2.2 Constructional requirements
- Table 6 – Cross-sectional areas (S) of test copper conductorscorresponding to the rated currents [Go to Page]
- 8.2.3 Mechanism and operating means
- 8.2.4 Clearances and creepage distances and distances through sealing compound
- Table 7 – Minimum clearances and creepage distances [Go to Page]
- 8.2.5 Screws, current-carrying parts and connections
- 8.2.6 Terminals for external conductors
- Table 8 – Connectable cross-sections of copper conductors for screw-type terminals
- 8.3 Protection against electric shock
- 8.4 Dielectric properties [Go to Page]
- 8.4.1 General
- 8.4.2 Dielectric properties
- 8.5 Temperature-rise
- 8.6 Making and breaking capacity
- Table 9 – Temperature-rise values
- 8.7 Performances [Go to Page]
- 8.7.1 General
- Table 10 – Making and breaking conditions for tests ofmaking and breaking capacities
- Table 11 – OFF-time durations for the verification of making and breakingcapacities for utilization categories [Go to Page]
- 8.7.2 Operating conditions
- 8.7.3 Operational performance
- 8.8 Resistance to heat
- 8.9 Resistance of insulating material to abnormal heat and to fire
- Table 12 – Making and breaking conditions for the operational performance
- Table 13 – Number of operations for operational performance
- 8.10 Resistance to rusting
- 8.11 Coordination with short-circuit protective devices (SCPDs)
- 8.12 EMC
- 8.13 Resistance to abnormal conditions
- 8.14 Components [Go to Page]
- 8.14.1 General
- 8.14.2 Fuses
- 8.14.3 Capacitors
- 8.14.4 Resistors
- 8.14.5 Transformers
- 9 Type tests [Go to Page]
- 9.1 General requirements [Go to Page]
- 9.1.1 Type tests and test sequences
- 9.1.2 Test conditions
- Table 14 – Capacitors
- Table 15 – Tightening torque for the verification of the mechanical strength of screw-type terminals [Go to Page]
- 9.1.3 Test procedure
- 9.2 Tests of indelibility of markings
- 9.3 Tests of the mechanical strength [Go to Page]
- 9.3.1 Tests of the resistance to mechanical stresses of insulating means
- Figure 6 – Pendulum impact test apparatus
- Figure 7 – Pendulum impact test apparatus (striking element)
- Figure 8 – Mounting support of specimens
- Figure 9 – Mounting block for a flush type SSE
- Figure 10 – Example of mounting support of panel board type SSE
- Figure 11 – Example of mounting support for a rear fixed SSE
- Table 16 – Height of fall for impact test
- Figure 12 – Application of forces on a rail-mounted SSE [Go to Page]
- 9.3.2 Verification of installation and connections
- Figure 13 – Determination of the direction of the forces to be applied [Go to Page]
- 9.3.3 Tests of fixings of covers, cover plates and actuating members
- Figure 14 – Direction for the conductor pull of 30 N for 1 min [Go to Page]
- 9.3.4 Tests of attachment of knobs
- Table 17 – Forces to be applied to covers, cover plates or actuating members whose fixing is not dependent on screws [Go to Page]
- 9.3.5 Tests of covers, cover plates or actuating members – Accessibility to live parts
- 9.3.6 Tests of covers, cover plates or actuating members – Accessibility to nonearthed metal parts separated from live parts
- 9.3.7 Tests of covers, cover plates or actuating members – Accessibility to insulating parts, earthed metal parts, the live parts of SELV ≤ 25 V AC or metal parts separated from live parts
- 9.3.8 Tests of covers, cover plates or actuating members – Application of gauges
- Figure 15 – Gauge (thickness: about 2 mm) for the verification ofthe outline of covers, cover plates or actuating members
- Figure 16 – Example of application of the gauge of Figure 15 on covers fixedwithout screws on a mounting surface or supporting surface [Go to Page]
- 9.3.9 Tests of grooves, holes and reverse tapers
- Figure 17 – Examples of applications of the gauge of Figure 15
- 9.4 Measurements of clearances and creepage distances
- Figure 18 – Gauge for verification of grooves, holes and reverse tapers
- Figure 19 – Sketch showing the direction of application of the gauge of Figure 18
- 9.5 Test of reliability of screws, current-carrying parts and connections
- 9.6 Test of reliability of screw-type terminals for external copper conductors
- Table 18 – Test values for pulling out test
- 9.7 Tests for the protection against electric shock
- Figure 20 – Jointed test finger(test probe B according to IEC 61032:1997)
- 9.8 Tests of dielectric properties [Go to Page]
- 9.8.1 General
- Figure 21 – Test pin for checking the protection against electric shock [Go to Page]
- 9.8.2 Tests of the resistance to humidity
- 9.8.3 Tests of the insulation resistance of the main circuits
- 9.8.4 Tests of the dielectric strength of main circuits
- Table 19 – Test voltage, points of application and minimum values ofinsulating resistance for the verification of dielectric strength [Go to Page]
- 9.8.5 Tests of the insulation resistance and dielectric strength of other circuits
- Table 20 – Test voltages of auxiliary circuits [Go to Page]
- 9.8.6 Verification of impulse withstand voltages (across clearances and through solid insulations)
- 9.9 Tests of temperature-rise [Go to Page]
- 9.9.1 General
- 9.9.2 Test setup
- Table 21 – Test voltage for verification of impulse withstand voltage
- Table 22 – Temperature-rise test currents and cross-sectional areas of copper conductors [Go to Page]
- 9.9.3 Test procedure
- 9.10 Tests of making and breaking capacity
- 9.11 Verification of performances [Go to Page]
- 9.11.1 General
- 9.11.2 Verification of interlocking function
- Figure 22 – Actuator test force
- Table 23 – Actuator test force [Go to Page]
- 9.11.3 Verification of controls, sequences and limits of operations
- Figure 23 – Test circuit for connection to source 1 and source 2 [Go to Page]
- 9.11.4 Verification of the operational performance capability
- 9.12 Tests of heat resistance [Go to Page]
- 9.12.1 Basic heating test
- 9.12.2 Ball-pressure test on parts of insulating material necessary to retain currentcarrying parts and parts of the earthing circuit in position
- 9.12.3 Ball-pressure test on parts of insulating material not necessary to retain current-carrying parts and parts of the earthing circuit in position
- 9.13 Tests of the resistance of insulating material to abnormal heat and to fire
- Figure 24 – Ball-pressure test apparatus
- Figure 25 – Diagrammatic representation
- 9.14 Resistance to rusting
- 9.15 Tests of coordination with short-circuit protective devices (SCPDs) [Go to Page]
- 9.15.1 General
- 9.15.2 Test conditions
- Figure 26 – Typical diagram for all coordination tests
- Figure 27 – Detail of impedances Z and Z1
- Table 24 – Minimum values of I2t and Ip
- Table 25 – Power factors for short-circuit tests [Go to Page]
- 9.15.3 Tests of coordination between the SSE and the SCPDs
- 9.16 EMC tests [Go to Page]
- 9.16.1 General
- 9.16.2 Electromagnetic emission
- 9.16.3 Electromagnetic immunity
- Table 26 – Immunity tests (overview)
- Table 27 – Performance criteria
- Table 28 – Voltage dip test values
- Table 29 – Short-interruption test values
- Table 30 – Surge test voltages
- Table 31 – Fast transient test values
- 9.17 Tests under abnormal conditions [Go to Page]
- 9.17.1 General
- Table 32 – Permissible temperature rise values [Go to Page]
- 9.17.2 Tests under fault conditions
- Figure 28 – Minimum clearances and creepage distances on printed boards [Go to Page]
- 9.17.3 Overload tests
- 9.18 Tests of components
- Figure 29 – Surge test – Test circuit
- Figure 30 – Surge test – Example of a switch to be used in the test circuit
- Annex A (informative)Examples of possible use of SSE [Go to Page]
- A.1 General concept of prosumer's low-voltage electrical installation
- Figure A.1 – Example of PEI
- Figure A.2 – Example of an individual PEI
- A.2 Examples of SSE use
- Figure A.3 – Example of a shared PEI with a distribution systemwithin the PEI in parallel to the DSO distribution system
- Figure A.4 – Example of SSE use in an individual PEI withPV production and storage on the DC side
- Figure A.5 – Example of SSE use in an individual PEI withPV production and storage on the AC side
- Figure A.6 – Example of SSE use for power backup with storage or a generating set
- Figure A.7 – Example of SSE use for power backup with storage only
- Annex B (informative)Correspondence between ISO and AWG copper conductors [Go to Page]
- Table B.1 – Correspondence between ISO and AWG copper conductors
- Annex C (normative)Determination of clearances and creepage distances [Go to Page]
- C.1 General
- C.2 Orientation and location of a creepage distance
- C.3 Creepage distances where more than one material is used
- C.4 Creepage distances split by floating conductive part
- C.5 Measurement of creepage distances and clearances
- Figure C.1 – Example 1
- Figure C.2 – Example 2
- Figure C.3 – Example 3
- Figure C.4 – Example 4
- Figure C.5 – Example 5
- Figure C.6 – Example 6
- Figure C.7 – Example 7
- Annex D (normative)Test sequences and number of specimens [Go to Page]
- Table D.1 – Test sequences and number of specimens for tests
- Annex E (normative)Arrangement for the detection of the emissionof ionized gases during short-circuit tests [Go to Page]
- Figure E.1 – Test arrangement
- Figure E.2 – Grid
- Figure E.3 – Grid circuit
- Bibliography [Go to Page]
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