eLibrary >
PD IEC TR 62433-4-1:2025 EMC IC modelling - Use of ICIM-CI model to predict the IC conducted immunity in a PCB >
PD IEC TR 62433-4-1:2025 EMC IC modelling - Use of ICIM-CI model to predict the IC conducted immunity in a PCB, 2025
- undefined
- CONTENTS
- FOREWORD
- 1 Scope
- 2 Normative references
- 3 Terms, definitions and abbreviations [Go to Page]
- 4 Philosophy
- 5 ICIM-CI model extraction flow [Go to Page]
- Figures [Go to Page]
- Table 1 – Examples of OO, failure criteria and DI for different types of IC [Go to Page]
- Table 2 – Examples of OO, failure criteria and DI for the IC under test [Go to Page]
- 6 Use of ICIM-CI model for immunity prediction on an application PCB [Go to Page]
- Annex A (informative) Example of ICIM-CI model written as SPICE subckt [Go to Page]
- Annex B (informative) Example of conducted immunity calculation applied to a LIN transceiver used in an automotive application [Go to Page]
- Table B.1 – OO, failure criteria and DI for the LIN transceiver under test [Go to Page]
- Bibliography [Go to Page]