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PD IEC/TR 62981:2017 Studies and comparisons of magnetic measurements on grain-oriented electrical steelsheet determined by the single sheet test method and Epstein test method, 2017
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- CONTENTS
- FOREWORD
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Background [Go to Page]
- 4.1 Historical background and former concepts of the SST-Epstein relationship
- Figures [Go to Page]
- Figure 1 – Epstein frame and single sheet tester, schematic view, windings partly omitted
- 4.2 Establishing reference values for grain-oriented electrical steels determined by independent SSTs – A new approach to the purpose
- 5 Preliminary comparisons and experiments [Go to Page]
- 5.1 General
- 5.2 Comparison of the relative difference δPSE = (PSST – Peps)/PEps measured by steel manufacturers on their own products using own set-ups
- Figure 2 – Relative difference δPSE = 100 (PSST – PEP) / PEP versus peak magnetic polarization J measured by six contributors on samples of their own products
- 5.3 Preliminary comparisons and experiments made by four Chinese laboratories using six SSTs with stacked yokes
- Figure 3 – Contact pattern for the measurement of lamination resistance in the air gap of SST yokes
- Figure 4 – Ratio of the power loss PSST to that of the SST with the best yokes, PSSTopt, versus lamination conductivity factor CY of the yokes
- 5.4 Necessity of comparing independent SST results
- Figure 5 – Ratio of the power loss at 100 Hz to that at 40 Hz, P100/P40, at 1,7 T, versus lamination conductivity factor CY of the yokes
- Figure 6 – Relative difference δPSE = 100(PSST – PEP) / PEP versus magnetic polarization
- Figure 7 – Relative difference δPSE = 100(PSST – PEP) / PEP at 1,7 T determined by three standard laboratories, IEN, NPL and PTB, on S- and P-type g.-o. sample pairs
- 6 International comparison of SST measurements on grain-oriented electrical steel and accompanying Epstein measurements [Go to Page]
- 6.1 General conditions, samples, participants
- Figure 8 – Dispersion of manufacturer’s grain-oriented material production in form of Epstein samples (PTB 1999)
- 6.2 Circulation of the samples and measurement procedure
- Tables [Go to Page]
- Table 1 – Participating laboratories
- 6.3 Results and analysis of the measured quantities
- Table 2 – Circulated grain-oriented electrical steel test samples
- Figure 9 – Example of scattering of the laboratories’ best estimates around the reference value (CGO sample No. 2, unweighted average, dash-dotted line)
- Figure 10 – Example of scattering of the laboratories’ best estimates around the reference value (HGO sample No. 4, unweighted average, dash-dotted line)
- Figure 11 – Example of scattering of the laboratories’ best estimates around the reference value (HGO sample No. 5, unweighted average, dash-dotted line)
- Figure 12 – Samples No. 1 to No. 5: ratio of SST to Epstein power loss reference values δPSE(Jp) = ( – ) / at 50 Hz versus peak polarization
- Table 3 – Reference values at 50 Hz for the power loss P and the apparent power S
- Table 4 – Standard deviations associated with the reference values at 50 Hzfor the power loss P and the apparent power S (Table 3)
- Table 5 – Reference values at 50 Hz of the polarization at H = 800 A/m J800 and standard deviation of the distribution of the laboratories’ best estimates
- Figure 13 – Overall dispersion (all labs, Jp values, and samples) of the laboratories' best estimates Pi of the power loss at 50 Hz around their reference values
- Figure 14 – Overall dispersion (all labs, Jp values, and samples)of the laboratories' best estimates Si of the apparent power at 50 Hzaround their reference values, with and without outliers
- Figure 15 – Dispersion around the reference value of the laboratories' best values of the power loss P measured at 50 Hz by the Epstein and the SST methods at 1,7 T
- Figure 16 – Dispersion around the reference value of the laboratories' best values of the apparent power S measured at 50 Hz by the Epstein and the SST methods at 1,7 T
- Figure 17 – Overall dispersion (European metrological laboratories only, all Jp values and samples) of the laboratories' best estimates Pi of the power loss at 50 Hz around their reference values, with and without outliers
- Table 6 – Relative standard deviations of 50 Hz power loss P and apparentpower S distributions around their reference values
- Figure 18 – Dispersion of the laboratories’ best estimatesof SST (a) and Epstein (b) power loss at 50 Hz
- Figure 19 – Dispersion of the laboratories’ best estimates of SST (a)and Epstein (b) power loss at 50 Hz
- 6.4 Conclusions of the international comparison
- Figure 20 – Dispersion of the laboratories’ best estimates, represented by the standard deviation σ of SST (red) and Epstein (blue) power loss (a) and apparent power (b) at 50 Hz, versus the peak value of the polarization, JP, summarizing Figures 18 and 19
- 7 Summary and conclusions
- Bibliography [Go to Page]
