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IEC 62951-3 Ed. 1.0 en:2018 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging >
IEC 62951-3 Ed. 1.0 en:2018 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging, 2018
- CONTENTS
- FOREWORD
- INTRODUCTION
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Test piece [Go to Page]
- 5 Test apparatus and procedure [Go to Page]
- 6 Test report
- Annex A (informative)Other types of electrical and mechanical test equipments [Go to Page]
- Annex B (informative)Failure pressure estimation
- Bibliography
- Figures [Go to Page]
- Table B.1 – Flexible substrate information (polyimide)
- Table B.2 – Pressure calculation results [Go to Page]