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Description of ASTM-E984 2012ASTM E984 - 12Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron SpectroscopyActive Standard ASTM E984 | Developed by Subcommittee: E42.03 Book of Standards Volume: 03.06 ASTM E984Significance and Use 4.1 Auger electron spectroscopy is often capable of yielding information concerning the chemical and physical environment of atoms in the near-surface region of a solid as well as giving elemental and quantitative information. This information is manifested as changes in the observed Auger electron spectrum for a particular element in the specimen under study compared to the Auger spectrum produced by the same element when it is in some reference form. The differences in the two spectra are said to be due to a chemical effect or a matrix effect. Despite sometimes making elemental identification and quantitative measurements more difficult, these effects in the Auger spectrum are considered valuable tools for characterizing the environment of the near-surface atoms in a solid. 1. Scope 1.1 This guide outlines the types of chemical effects and matrix effects which are observed in Auger electron spectroscopy. 1.2 Guidelines are given for the reporting of chemical and matrix effects in Auger spectra. 1.3 Guidelines are given for utilizing Auger chemical effects for identification or characterization. 1.4 This guide is applicable to both electron excited and X-ray excited Auger electron spectroscopy. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
ASTM Standards E673 Terminology Relating to Surface Analysis E827 Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy E983 Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy E996 Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy Other Documents ISO18118:2004 Surface Chemical Analysis--Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy--Guide to the Use of Experimentally Determined Relative Sensitivity Factors for the Quantitative Analysis of Homogenous MaterialsKeywords Auger electron spectroscopy; chemical effect; matrix effect; spectroscopy; ICS Code ICS Number Code 71.040.50 (Physicochemical methods of analysis) DOI: 10.1520/E0984-12 ASTM International is a member of CrossRef. ASTM E984This book also exists in the following packages...Subscription InformationMADCAD.com ASTM Standards subscriptions are annual and access is unlimited concurrency based (number of people that can access the subscription at any given time) from single office location. For pricing on multiple office location ASTM Standards Subscriptions, please contact us at info@madcad.com or +1 800.798.9296.
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About ASTMASTM International, formerly known as the American Society for Testing and Materials (ASTM), is a globally recognized leader in the development and delivery of international voluntary consensus standards. Today, some 12,000 ASTM standards are used around the world to improve product quality, enhance safety, facilitate market access and trade, and build consumer confidence. ASTM’s leadership in international standards development is driven by the contributions of its members: more than 30,000 of the world’s top technical experts and business professionals representing 150 countries. Working in an open and transparent process and using ASTM’s advanced electronic infrastructure, ASTM members deliver the test methods, specifications, guides, and practices that support industries and governments worldwide. |
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