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eLibrary > ASME B46.1-2019: Surface Texture (Surface Roughness, Waviness, and Lay) >

ASME B46.1-2019: Surface Texture (Surface Roughness, Waviness, and Lay), 2019

CONTENTS
FOREWORD
ASME B46 COMMITTEE ROSTER
CORRESPONDENCE WITH THE B46 COMMITTEE
EXECUTIVE SUMMARY
ASME B46.1-2019 SUMMARY OF CHANGES
Section 1 Terms Related to Surface Texture [Go to Page]
1-1 GENERAL [Go to Page]
1-1.1 Scope
1-1.2 Limitations
1-1.3 SI Values
1-1.4 References
1-1.5 Cleanliness
1-2 DEFINITIONS RELATED TO SURFACES [Go to Page]
1-2.1 Surfaces
1-2.2 Components of the Real Surface
1-3 DEFINITIONS RELATED TO THE MEASUREMENT OF SURFACE TEXTURE BY PROFILING METHODS [Go to Page]
1-3.1 Profiles
1-3.2 Reference Lines
1-3.3 Peaks and Valleys, Height Resolution, and Height Range
1-3.4 Spacings
1-3.5 Measurement and Analysis Lengths
1-4 DEFINITIONS OF SURFACE PARAMETERS FOR PROFILING METHODS [Go to Page]
1-4.1 Height (z) Parameters
1-4.2 Spacing Parameters
1-4.3 Shape Parameters and Functions
1-4.4 Hybrid Parameters
1-4.5 Linear Material Ratio Curve Height Parameters
1-4.6 Material Probability Curve Height Parameters
1-5 DEFINITIONS RELATED TO THE MEASUREMENT OF SURFACE TEXTURE BY AREA PROFILING AND AREA AVERAGING METHODS [Go to Page]
1-5.1 General
1-5.2 Reference Mean Surfaces
1-5.3 Area Peaks and Valleys
1-5.4 Sampling Areas
1-6 DEFINITIONS OF SURFACE PARAMETERS FOR AREA PROFILING AND AREA AVERAGING METHODS [Go to Page]
1-6.1 Height Parameters
1-6.2 Waviness Parameter
1-6.3 Area Spacing Parameters
1-6.4 Shape Parameters
1-6.5 Other Parameters
Section 2 Classification of Instruments for Surface Texture Measurement [Go to Page]
2-1 SCOPE
2-2 RECOMMENDATION
2-3 CLASSIFICATION SCHEME [Go to Page]
2-3.1 Type I: Profiling, Contact, Skidless Instruments
2-3.2 Type II: Profiling, Noncontact Instruments
2-3.3 Type III: Scanned Probe Microscopes
2-3.4 Type IV: Profiling, Contact, Skidded Instruments
2-3.5 Type V: Skidded Instruments With Parameters Only
2-3.6 Type VI: Area Averaging Methods
Section 3 Terminology and Measurement Procedures for Profiling, Contact, Skidless Instruments [Go to Page]
3-1 SCOPE
3-2 REFERENCES
3-3 TERMINOLOGY [Go to Page]
3-3.1 Profiling, Contact, Skidless Instruments
3-3.2 Measuring Loop
3-3.3 Profile Coordinate System
3-3.4 Stylus
3-3.5 Pickup
3-3.6 Drive Unit
3-3.7 Amplifier
3-3.8 Analog-to-Digital Conversion
3-3.9 Primary Measured Profile
3-3.10 Instrument Sinusoidal Transmission Function
3-3.11 Instrument Nonlinearity
3-3.12 Instrument Measuring Range
3-3.13 Instrument Measuring z Resolution
3-3.14 Instrument z Range-to-Resolution Ratio
3-3.15 Zero Point Drift
3-3.16 Residual Profile
3-3.17 x-Axis Profile Component Deviations
3-3.18 Short-Wave Transmission Limit
3-3.19 Profile Filter
3-3.20 Profile Filter Cutoff Selection
3-3.21 Profile Recording and Display
3-3.22 Profile Evaluation
3-4 MEASUREMENT PROCEDURE [Go to Page]
3-4.1 Stylus Inspection
3-4.2 Instrument Calibration
3-4.3 Workpiece Cleanliness
3-4.4 Workpiece Fixturing
3-4.5 Instrument/Workpiece Leveling and Alignment
3-4.6 Assessment of the Workpiece Surface
Section 4 Measurement Procedures for Contact, Skidded Instruments [Go to Page]
4-1 SCOPE [Go to Page]
4-1.1 General
4-1.2 Type IV and Type V Instruments
4-2 REFERENCES
4-3 PURPOSE
4-4 INSTRUMENTATION [Go to Page]
4-4.1 Roughness Average Value Ra From Averaging and Digital Readout Instruments
4-4.2 Cutoff Selection
4-4.3 Response Time for Analog Averaging Instruments
4-4.4 Traversing Length for Analog Averaging Instruments
4-4.5 Stylus Probe
4-4.6 Fringe-Field Capacitance (FFC) Probe
4-4.7 Possible Sources of Skid Errors
4-4.8 Instrument Accuracy
4-4.9 Operational Accuracy
Section 5 Measurement Techniques for Area Profiling [Go to Page]
5-1 SCOPE
5-2 REFERENCES
5-3 RECOMMENDATIONS
5-4 IMAGING METHODS
5-5 SCANNING METHODS
Section 6 Measurement Techniques for Area Averaging [Go to Page]
6-1 SCOPE
6-2 EXAMPLES OF AREA AVERAGING METHODS
Section 7 Nanometer Surface Texture and Step Height Measurements by Stylus Profiling Instruments [Go to Page]
7-1 SCOPE
7-2 APPLICABLE DOCUMENTS
7-3 DEFINITIONS [Go to Page]
7-3.1 Step Height, Zs
7-3.2 Noise
7-3.3 Type A Evaluation (of Uncertainty)
7-3.4 Type B Evaluation (of Uncertainty)
7-3.5 Standard Uncertainty
7-3.6 Combined Standard Uncertainty
7-3.7 Expanded Uncertainty
7-3.8 Coverage Factor, k
7-4 RECOMMENDATIONS [Go to Page]
7-4.1 Instruments
7-4.2 Methodology
7-4.3 Environment
7-5 PREPARATION FOR MEASUREMENT [Go to Page]
7-5.1 Instruments
7-5.2 Environment
7-6 CALIBRATION ARTIFACTS [Go to Page]
7-6.1 Calibration Specimens
7-6.2 Calibrated Displacement Actuators
7-6.3 Ultrasmooth Surface Artifacts
7-6.4 Artifact Calibration Requirements
7-7 REPORTS [Go to Page]
7-7.1 Data
7-7.2 Annotations to the Data
7-7.3 Reporting Example
Section 8 Nanometer Surface Roughness as Measured With Phase Measuring Interferometric Microscopy [Go to Page]
8-1 SCOPE
8-2 DESCRIPTION AND DEFINITIONS: NONCONTACT PHASE MEASURING INTERFEROMETER
8-3 KEY SOURCES OF UNCERTAINTY
8-4 NONCONTACT PHASE MEASURING INTERFEROMETER INSTRUMENT REQUIREMENTS [Go to Page]
8-4.1 Tilt Adjustment
8-4.2 Sample Stage
8-4.3 Focusing Means
8-4.5 Reference Path rms Variation
8-5 TEST METHODS [Go to Page]
8-5.1 Instrument Preparations and Environmental Stability
8-5.2 Instrument Accuracy
8-6 MEASUREMENT PROCEDURES [Go to Page]
8-6.1 Direct Profile Method
8-6.2 Subtract Reference Method
8-6.3 Absolute Rq Method
8-7 DATA ANALYSIS AND REPORTING
8-8 REFERENCES
Section 9 Filtering of Surface Profiles [Go to Page]
9-1 SCOPE
9-2 REFERENCES
9-3 DEFINITIONS AND GENERAL SPECIFICATIONS [Go to Page]
9-3.1 Notes on Terms Defined Previously
9-3.2 Definitions of Terms Associated With Filtering
9-4 2RC FILTER SPECIFICATION FOR ROUGHNESS [Go to Page]
9-4.1 The 2RC Transmission Band
9-4.2 Long-Wavelength Cutoff
9-4.3 Transmission Characteristics
9-4.4 2RC Filter Long-Wavelength Roughness Weighting Function
9-5 PHASE CORRECT GAUSSIAN FILTER FOR ROUGHNESS [Go to Page]
9-5.1 Phase Correct Gaussian Filter Mean Line
9-5.2 Gaussian Filter Roughness Profile
9-5.3 Long-Wavelength Cutoff of the Gaussian Phase Correct Filter
9-5.4 Short-Wavelength Cutoff of the Gaussian Roughness Profile
9-5.5 Short-Wavelength Transmission Characteristic
9-5.6 Weighting Function for the Roughness Short-Wavelength Cutoff
9-5.7 Weighting Function for the Roughness Long-Wavelength Cutoff
9-5.8 Transmission Characteristic of the Gaussian-Filtered Waviness Profile (Roughness Mean Line)
9-5.9 Transmission Characteristic of the Gaussian Filtered Roughness Profile
9-5.10 Errors of Approximations to the Gaussian Filter
9-5.11 Transmission Band
9-5.12 Cutoff Ratio
9-6 FILTERING FOR WAVINESS [Go to Page]
9-6.1 Gaussian Filter Waviness Profile
9-6.2 Waviness Long-Wavelength Cutoff and Evaluation Length
9-6.3 Waviness Traversing Length
9-6.4 Methods for Determining the Waviness Mean Line
9-6.5 Waviness Transmission Band
9-7 FILTERING OF SURFACES WITH STRATIFIED FUNCTIONAL PROPERTIES
Section 10 Terminology and Procedures for Evaluation of Surface Textures Using Fractal Geometry [Go to Page]
10-1 GENERAL [Go to Page]
10-1.1 Scope
10-1.2 Limitations
10-2 DEFINITIONS RELATIVE TO FRACTAL-BASED ANALYSIS OF SURFACES [Go to Page]
10-2.1 Basic Terms Relating to Fractal Geometry of Engineering Surfaces
10-2.2 Analysis Methods and Associated Terms
10-3 REPORTING THE RESULTS OF FRACTAL ANALYSES [Go to Page]
10-3.1 Limits on the Scales of Observation
10-3.2 Plot of a Geometric Property Versus Scale
10-3.3 Complexity Parameter
10-3.4 Fractal Dimension
10-3.5 Slope of Plots of Geometric Property Versus Scale
10-3.6 Smooth-Rough Crossovers (SRC)
10-4 REFERENCES
Section 11 Specifications and Procedures for Precision Reference Specimens [Go to Page]
11-1 SCOPE
11-2 REFERENCES
11-3 DEFINITIONS
11-4 REFERENCE SPECIMENS: PROFILE SHAPE AND APPLICATION [Go to Page]
11-4.1 Amplification (Step Height): Type A
11-4.2 Stylus Condition: Type B
11-4.3 Parameter Measurements: Type C
11-4.4 Overall Instrument Performance: Type D
11-5 PHYSICAL REQUIREMENTS [Go to Page]
11-5.1 Materials
11-5.2 Size of the Specimen
11-5.3 Waviness and Flatness Limits
11-6 ASSIGNED VALUE CALCULATION
11-7 MECHANICAL REQUIREMENTS [Go to Page]
11-7.1 Types A1 and A2
11-7.2 Types B1, B2, and B3
11-7.3 Types C1, C2, C3, and C4
11-7.4 Types D1 and D2
11-8 MARKING
11-9 CALIBRATION INTERVAL
Section 12 Specifications and Procedures for Roughness Comparison Specimens [Go to Page]
12-1 SCOPE
12-2 REFERENCES
12-3 DEFINITIONS
12-4 ROUGHNESS COMPARISON SPECIMENS [Go to Page]
12-4.1 Individually Manufactured (Pilot) Specimens
12-4.2 Replica Specimens
12-5 SURFACE CHARACTERISTICS
12-6 NOMINAL ROUGHNESS GRADES
12-7 SPECIMEN SIZE, FORM, AND LAY
12-8 CALIBRATION OF COMPARISON SPECIMENS
12-9 MARKING
Figures [Go to Page]
Figure 1-2.1-1 Schematic Diagram of Surface Characteristics
Figure 1-3.1-1 Measured Versus Nominal Profile
Figure 1-3.1.1-1 Stylus Profile Displayed With Two Different Aspect Ratios
Figure 1-3.2-1 Filtering a Surface Profile
Figure 1-3.2-2 Examples of Nominal Profiles
Figure 1-3.3-1 Profile Peak, Valley, and Element
Figure 1-3.5-1 Surface Profile Measurement Lengths
Figure 1-4.1.1-1 Rt, Rp, and Rv Parameters
Figure 1-4.1.1-2 The Rt and Rmax Parameters
Figure 1-4.1.1-3 Illustration for the Calculation of Roughness Average Ra
Figure 1-4.1.1-4 Surface Profile Containing Two Sampling Lengths, l1 and l2, Also Showing the Rpi and Rti Parameters
Figure 1-4.1.2-1 The Waviness Height, Wt
Figure 1-4.2-1 The Mean Spacing of Profile Elements, RSm
Figure 1-4.2-2 The Peak Count Level, Used for Calculating Peak Density
Figure 1-4.3-1 Amplitude Density Function — ADF(z) or p(z)
Figure 1-4.3-2 The Bearing Area Curve and Related Parameters
Figure 1-4.3-3 Three Surface Profiles With Different Kurtosis
Figure 1-4.3-4 The Profile Bearing Length
Figure 1-4.3-5 Three Surface Profiles With Different Skewness
Figure 1-5.1-1 Topographic Map Obtained by an Area Profiling Method
Figure 1-5.3-1 Area Peaks (Left) and Area Valleys (Right)
Figure 1-6.3-1 Comparison of Profiles Measured in Two Directions on a Uniaxial Periodic Surface Showing the Difference in Peak Spacing as a Function of Direction
Figure 1-6.5-1 Indication of Surface Lay
Figure 2-1-1 Classification of Common Instruments for Measurement of Surface Texture
Figure 3-3.3-1 Profile Coordinate System
Figure 3-3.4.2-1 Conical Stylus Tip
Figure 3-3.4.3-1 Other Stylus Tip Geometries
Figure 3-3.8.3-1 Aliasing
Figure 4-1.2-1 Schematic Diagrams of a Typical Stylus Probe and Fringe-Field Capacitance Probe
Figure 4-4.2-1 Effects of Various Cutoff Values
Figure 4-4.7-1 Examples of Profile Distortion Due to Skid Motion
Figure 4-4.7-2 Examples of Profile Distortion
Figure 7-4.2.4-1 The Radius of Curvature for a Surface Sine Wave
Figure 7-4.2.5-1 Stylus Tip Touching Bottom and Shoulders of Groove
Figure 7-4.2.5-2 The Stylus Tip Contact Distance, x
Figure 8-2-1 A Typical Phase Measuring Interferometer System
Figure 8-2-2 Demonstration of the Detector Array With Element Spacing, Δ, and the Measurement of the Longest Spatial Wavelength, λL, Covering the Total Number of Pixels, N
Figure 8-2-3 Demonstration of the Detector Array With Element Spacing, Δ, and the Measurement of the Smallest Spatial Wavelength, λR, Covering Five Pixels
Figure 9-3.2-1 Wavelength Transmission Characteristics for the 2RC Filter System
Figure 9-3.2-2 Gaussian Transmission Characteristics Together With the Uncertain Nominal Transmission Characteristic of a 2 μm Stylus Radius
Figure 9-3.2-3 Weighting Function of the Gaussian Profile Filter
Figure 9-5.8-1 Gaussian Transmission Characteristic for the Waviness Short-Wavelength Cutoff, λsw, or for Deriving the Roughness Mean Line Having Cutoff Wavelengths, λc
Figure 9-5.9-1 Gaussian Transmission Characteristic for the Roughness Long-Wavelength Cutoff Having Cutoff Wavelengths, λc
Figure 9-5.10-1 Example of a Deviation Curve of an Implemented Filter From the Ideal Gaussian Filter as a Function of Spatial Wavelength
Figure 10-2.1.3-1 Self-Similarity Illustrated on a Simulated Profile
Figure 10-2.1.4-1 An Idealized Log-Log Plot of Relative Length (of a Profile) or Relative Area (of a Surface) Versus the Scale of Observation
Figure 10-2.1.9-1 An Idealized Log-Log Plot of Relative Length or Relative Area Versus the Scale of Observation (Length-Scale or Area-Scale Plot), Showing Multifractal Characteristics and Crossover Scales
Figure 10-2.2.1-1 Three Stepping Exercises From a Length-Scale Analysis on a Simulated Profile
Figure 10-2.2.2-1 Four Tiling Exercises From an Area-Scale Analysis
Figure 10-2.2.2.4-1 An Area-Scale Plot Including the Results of the Tiling Series in Figure 10-2.2.2-1
Figure 11-4.1-1 Type A1 Groove
Figure 11-4.1-2 Type A2 Groove
Figure 11-5.3-1 Allowable Waviness Height, Wt, for Roughness Calibration Specimens
Figure 11-7.1-1 Assessment of Calibrated Values for Type A1
Figure 11-7.2-1 Type B1 Grooves: Set of Four Grooves
Figure 11-7.2-2 Type B2 or Type C2 Specimens With Multiple Grooves
Figure 11-7.2-3 Use of Type B3 Specimen
Figure 11-7.3-1 Type C1 Grooves
Figure 11-7.3-2 Type C3 Grooves
Figure 11-7.3-3 Type C4 Grooves
Figure 11-7.4-1 Unidirectional Irregular Groove Specimen Having Profile Repetition at 5λc Intervals (Type D1 With λc = 0.8 mm)
Figure B-2-1 Surface Roughness Produced by Common Production Methods
Figure C-2.2-1 Schmaltz Profile Microscope
Figure C-2.3-1 Reflectance Measurement
Figure C-2.4-1 Schematic Diagram of Circular Path Profiler
Figure C-2.5-1 Multiple-Beam Interferometer
Figure C-2.6-1 Differential Interference Contrast Photograph of Automobile Engine Cylinder Wall
Figure C-2.7-1 Differential Interferometry
Figure C-3-1 Zehender Method
Figure C-4.1-1 Comparison of Optical and Transmission Electron Microscopes
Figure C-4.2-1 Diagram of Scanning Electron Microscope
Figure D-2.1-1 Average Peak-to-Valley Roughness
Figure D-2.2-1 Average Spacing of Roughness Peaks
Figure D-2.3-1 Swedish Height of Irregularities
Figure D-3-1 Measured Profiles and Their Autocorrelation Functions
Figure E-3.1.1-1 Schematic Diagram of an Optical Focus-Sensing Instrument
Figure E-3.2.1-1 Schematic Diagram of Nomarski Differential Profiler
Figure E-3.3.1-1 Area Scanning Stylus Profiler
Figure E-3.4.1-1 Basic Structure of an Early STM
Figure E-3.5.1-1 Schematic Diagram of an Atomic Force Microscope With an Optical Lever Sensor
Figure E-3.6-1 Schematic Diagram of a Confocal Microscope
Figure F-1-1 Comparison of Roughness Void Volumes
Figure F-1-2 Principle of Capacitance Between Parallel Plates
Figure F-2-1 Schematic Diagram of an Instrument for Measuring TIS
Figure F-3-1 Schematic Diagram of an Instrument for Measuring ARS or BRDF
Figure H-4-1 Subroutines
Figure K-4.1-1 Roughness, Rz, Versus Feed
Figure K-4.2-1 Mean Relative Areas Versus Scale, μm, From Surfaces Created With All Five Discharge Pulse Energies
Figure K-4.2-2 Mean Area-Scale Fractal Complexities (Asfc) Versus Scale for All Pulse Energies
Figure K-4.2-3 Multiscale Correlation Strengths of the First Kind
Figure K-4.3-1 Example of Regression Analysis and a Strong Functional Correlation
Figure K-4.3-2 Multiscale Correlation Strengths of the Second Kind
Tables [Go to Page]
Table 3-3.20.1-1 Cutoff Values for Periodic Profiles Using RSm
Table 3-3.20.2-1 Cutoff Values for Nonperiodic Profiles Using Ra
Table 4-4.2-1 Measurement Cutoffs and Traversing Lengths for Continuously Averaging Instruments Using Analog Meter Readouts
Table 4-4.2-2 Measurement Cutoffs and Minimum Evaluation Lengths for Instruments Measuring Integrated Roughness Values Over a Fixed Evaluation Length
Table 9-4.3.2-1 Limits for the Transmission Characteristics for 2RC Long-Wavelength Cutoff Filters
Table 9-5.11-1 Typical Cutoffs for Gaussian Filters and Associated Cutoff Ratios
Table 9-6.3-1 Typical Values for the Waviness Long-Wavelength Cutoff, λcw, and Recommended Minimum Values for the Waviness Traversing Length
Table 10-3-1 Example of a Report on Fractal Analysis
Table 11-7.1-1 Nominal Values of Depth or Height and Examples of Width for Type A1
Table 11-7.1-2 Nominal Values of Depth and Radius for Type A2
Table 11-7.1-3 Tolerances and Uncertainties for Types A1 and A2
Table 11-7.2-1 Tip Size Estimation From the Profile Graph for Type B1
Table 11-7.3-1 Typical Ra and RSm Values for Type C1
Table 11-7.3-2 Tolerances and Uncertainties for Types C1 Through C4
Table 11-7.3-3 Typical Values of Ra and RSm for Type C2
Table 11-7.3-4 Typical Values of Ra for Type C4
Table 11-7.4-1 Tolerances and Uncertainties for Types D1 and D2
Table 12-6-1 Nominal Roughness Grades, Ra, for Roughness Comparison Specimens
Table 12-7-1 Form and Lay of Roughness Comparison Specimens Representing Various Types of Machined Surfaces
Table 12-8-1 Examples of Sampling Lengths for Calibration of Comparison Specimens, mm
Table I-1 ASME B46.1-2019 Parameters
Table J-1 Reference Standards
Table K-3-1 Elements for Reporting a Functional Correlation
NONMANDATORY APPENDICES [Go to Page]
NONMANDATORY APPENDIX A GENERAL NOTES ON USE AND INTERPRETATION OF DATA PRODUCED BY STYLUS INSTRUMENTS [Go to Page]
A-1 INTRODUCTION
A-2 ROUGHNESS AVERAGE
A-3 STYLUS TIP RADIUS
A-4 SKIDDED MEASUREMENTS
A-5 TRAVERSING LENGTH AND MEASUREMENT STATISTICS
A-6 FILTER CUTOFF SELECTION
A-7 METHODS FOR ROUGHNESS AND WAVINESS SEPARATION
NONMANDATORY APPENDIX B CONTROL AND PRODUCTION OF SURFACE TEXTURE [Go to Page]
B-1 SPECIFICATION
B-2 PRODUCTION
B-3 INSPECTION
B-4 SURFACE TEXTURE OF CASTINGS
B-5 SURFACE TEXTURE OF PARTS FABRICATED BY ADDITIVE MANUFACTURING
NONMANDATORY APPENDIX C A REVIEW OF ADDITIONAL SURFACE MEASUREMENT METHODS [Go to Page]
C-1 INTRODUCTION
C-2 OPTICAL METHODS
C-3 REPLICAS
C-4 ELECTRON MICROSCOPE METHODS
C-5 SURFACE EXAMINATION REFERENCES
NONMANDATORY APPENDIX D ADDITIONAL PARAMETERS FOR SURFACE CHARACTERIZATION [Go to Page]
D-1 INTRODUCTION
D-2 INTERNATIONAL STANDARDS AND PARAMETERS
D-3 AUTOCOVARIANCE FUNCTION (ACV)
D-4 UNIFORMITY OF SURFACE
D-5 GENERAL REFERENCES ON SURFACE TEXTURE MEASUREMENTS
NONMANDATORY APPENDIX E CHARACTERISTICS OF CERTAIN AREA PROFILING METHODS [Go to Page]
E-1 INTRODUCTION
E-2 IMAGING METHODS
E-3 SCANNING METHODS
E-4 REFERENCES
NONMANDATORY APPENDIX F DESCRIPTIONS OF AREA AVERAGING METHODS [Go to Page]
F-1 PARALLEL PLATE CAPACITANCE (PPC)
F-2 TOTAL INTEGRATED SCATTER (TIS)
F-3 ANGLE RESOLVED SCATTER (ARS)
F-4 REFERENCES
NONMANDATORY APPENDIX G OBSERVATIONS ON THE FILTERING OF SURFACE PROFILES [Go to Page]
G-1 INTRODUCTION
G-2 DIGITAL INSTRUMENTS
NONMANDATORY APPENDIX H REFERENCE SUBROUTINES [Go to Page]
H-1 INTRODUCTION
H-2 REFERENCE
H-3 SOURCE CODE
H-4 SUBROUTINES
NONMANDATORY APPENDIX I A COMPARISON OF ASME AND ISO SURFACE TEXTURE PARAMETERS
NONMANDATORY APPENDIX J FUNCTIONAL STANDARDS
NONMANDATORY APPENDIX K SUGGESTED TERMINOLOGY AND PROCEDURES FOR THE EVALUATION OF FUNCTIONAL CORRELATIONS OF SURFACE TEXTURES WITH PROCESSING AND PERFORMANCE [Go to Page]
K-1 GENERAL
K-2 DEFINITIONS RELATIVE TO FUNCTIONAL CORRELATIONS
K-3 REPORT OF FUNCTIONAL CORRELATIONS
K-4 EXAMPLES
K-5 REFERENCES
K-6 BIBLIOGRAPHY OF ARTICLES WITH FUNCTIONAL CORRELATIONS [Go to Page]

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